%0 Journal Article
%T Phase-slip lines as a resistance mechanism in transition-edge sensors
%A Bennett, Douglas A.
%A Schmidt, Daniel R.
%A Swetz, Daniel S.
%A Ullom, Joel N.
%J Appl. Phys. Lett.
%D 2014
%V 104
%F Bennett_etal2014
%O Recommended by Klapwijk
%O exported from refbase (https://db.rplab.ru/refbase/show.php?record=929), last updated on Mon, 30 Jun 2014 11:04:07 -0500
%X The fundamental mechanism of resistance in voltage-biased superconducting films is poorly understood despite its importance as the basis of transition-edge sensors (TESs). TESs are utilized in state-of-the-art microbolometers and microcalorimeters covering a wide range of energies and applications. We present a model for the resistance of a TES based on phase-slip lines (PSLs) and compare the model to data. One of the model's predictions, discrete changes in the number of PSLs, is a possible explanation for the observed switching between discrete current states in localized regions of bias.
%K microbolometers
%K TES
%K phase-slip lines
%K PSL
%R 10.1063/1.4863664
%U https://doi.org/10.1063/1.4863664
%P 042602