PT Journal
AU Bennett, DA
   Schmidt, DR
   Swetz, DS
   Ullom, JN
TI Phase-slip lines as a resistance mechanism in transition-edge sensors
SO Appl. Phys. Lett.
JI Appl. Phys. Lett.
PY 2014
BP 042602
VL 104
DI 10.1063/1.4863664
DE microbolometers; TES; phase-slip lines; PSL
AB The fundamental mechanism of resistance in voltage-biased superconducting films is poorly understood despite its importance as the basis of transition-edge sensors (TESs). TESs are utilized in state-of-the-art microbolometers and microcalorimeters covering a wide range of energies and applications. We present a model for the resistance of a TES based on phase-slip lines (PSLs) and compare the model to data. One of the model's predictions, discrete changes in the number of PSLs, is a possible explanation for the observed switching between discrete current states in localized regions of bias.
ER