TY  - JOUR
AU  - Bennett, Douglas A.
AU  - Schmidt, Daniel R.
AU  - Swetz, Daniel S.
AU  - Ullom, Joel N.
PY  - 2014
DA  - 2014//
TI  - Phase-slip lines as a resistance mechanism in transition-edge sensors
T2  - Appl. Phys. Lett.
JO  - Appl. Phys. Lett.
SP  - 042602
VL  - 104
KW  - microbolometers
KW  - TES
KW  - phase-slip lines
KW  - PSL
AB  - The fundamental mechanism of resistance in voltage-biased superconducting films is poorly understood despite its importance as the basis of transition-edge sensors (TESs). TESs are utilized in state-of-the-art microbolometers and microcalorimeters covering a wide range of energies and applications. We present a model for the resistance of a TES based on phase-slip lines (PSLs) and compare the model to data. One of the model's predictions, discrete changes in the number of PSLs, is a possible explanation for the observed switching between discrete current states in localized regions of bias.
UR  - https://doi.org/10.1063/1.4863664
DO  - 10.1063/1.4863664
N1  - Recommended by Klapwijk
ID  - Bennett_etal2014
ER  -