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Author  |
Title | Year | Publication | Volume | Pages |
|---|---|---|---|---|---|
| Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. | PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis | 2000 | Microelectronics Reliability | 40 | 1353-1358 |
| Smirnov, K.; Korneev, A.; Minaeva, O.; Divochiy, A.; Tarkhov, M.; Ryabchun, S.; Seleznev, V.; Kaurova, N.; Voronov, B.; Gol'tsman, G.; Polonsky, S. | Ultrathin NbN film superconducting single-photon detector array | 2007 | J. Phys.: Conf. Ser. | 61 | 1081-1085 |