| Home | << 1 >> |
|
Author  |
Title | Year | Publication | Volume | Pages |
|---|---|---|---|---|---|
| Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. | PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis | 2000 | Microelectronics Reliability | 40 | 1353-1358 |