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Dauler, E. A.; Kerman, A. J.; Robinson, B. S.; Yang, J. K. W.; Voronov, B. M.; Gol’tsman, G. N.; Berggren, K. K. Achieving high counting rates in superconducting nanowire single-photon detectors 2006 CLEO/QELS JTuD3 (1 to 2) details   doi
Rosfjord, K. M.; Yang, J. K. W.; Dauler, E. A.; Anant, V.; Berggren, K. K.; Kerman, A. J.; Voronov, B. M.; Gol’tsman, G. N. Increased detection efficiencies of nanowire single-photon detectors by integration of an optical cavity and anti-reflection coating 2006 CLEO/QELS JTuF2 (1 to 2) details   doi
Sobolewski, R.; Verevkin, A.; Gol’tsman, G. N. Superconducting optical single-photon detectors 2004 CLEO/QELS IThD1 details   doi
Zhang, J.; Pearlman, A.; Slysz, W.; Verevkin, A.; Sobolewski, R.; Okunev, O.; Korneev, A.; Kouminov, P.; Smirnov, K.; Chulkova, G.; Gol’tsman, G. N.; Lo, W.; Wilsher, K. Infrared picosecond superconducting single-photon detectors for CMOS circuit testing 2003 CLEO/QELS Cmv4 details   url
Gershenzon, E. M.; Gol'tsman, G. N.; Zorin, M. A.; Karasik, B. S.; Trifonov, V. A. Nonequilibrium and bolometric response of YBaCuO films in a resistive state to infrared low intensity radiation 1994 Council on Low-temp. Phys. 82-83 details   url
Chulcova, G. M.; Ptitsina, N. G.; Gershenzon, E. M.; Gershenzon, M. E.; Sergeev, A. V. Effect of the interference between electron-phonon and electron-impurity (boundary) scattering on resistivity Nb, Al, Be films 1996 Czech J. Phys. 46 2489-2490 details   doi
Il'in, K. S.; Karasik, B. S.; Ptitsina, N. G.; Sergeev, A. V.; Gol'tsman, G. N.; Gershenzon, E. M.; Pechen, E. V.; Krasnosvobodtsev, S. I. Electron-phonon-impurity interference in thin NbC films: electron inelastic scattering time and corrections to resistivity 1996 Czech. J. Phys. 46 857-858 details   doi
Lobanov, Y. V.; Shcherbatenko, M. L.; Semenov, A. V.; Kovalyuk, V. V.; Korneev, A. A.; Goltsman, G. N.; Vinogradov, E. A.; Naumov, A. V.; Gladush, M. G.; Karimullin, K. R. Heterodyne spectroscopy with superconducting single-photon detector 2017 EPJ Web Conf. 132 01005 details   doi
Prokhodtsov, A.; Golikov, A.; An, P.; Kovalyuk, V.; Goltsman, G.; Arakelyan, S.; Evlyukhin, A.; Kalachev, A.; Naumov, A. Effect of silicon oxide coating on a silicon nitride focusing grating coupler efficiency 2019 EPJ Web Conf. 220 02009 details   doi
Elmanov, I.; Elmanova, A.; Komrakova, S.; Golikov, A.; Kaurova, N.; Kovalyuk, V.; Goltsman, G.; Arakelyan, S.; Evlyukhin, A.; Kalachev, A.; Naumov, A. Method for determination of resists parameters for photonic – integrated circuits e-beam lithography on silicon nitride platform 2019 EPJ Web Conf. 220 03012 details   doi
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