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Author  |
Zhang, J.; Pearlman, A.; Slysz, W.; Verevkin, A.; Sobolewski, R.; Okunev, O.; Korneev, A.; Kouminov, P.; Smirnov, K.; Chulkova, G.; Gol’tsman, G. N.; Lo, W.; Wilsher, K. |
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Title |
Infrared picosecond superconducting single-photon detectors for CMOS circuit testing |
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Conference Article |
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Year |
2003 |
Publication |
CLEO/QELS |
Abbreviated Journal |
CLEO/QELS |
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Pages |
Cmv4 |
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Keywords |
NbN SSPD; SNSPD; Infrared; Quantum detectors; Electron beam lithography; Infrared detectors; Infrared radiation; Quantum efficiency; Single photon detectors; Superconductors |
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Abstract |
Novel, NbN superconducting single-photon detectors have been developed for ultrafast, high quantum efficiency detection of single quanta of infrared radiation. Our devices have been successfully implemented in a commercial VLSI CMOS circuit testing system. |
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Publisher |
Optical Society of America |
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Conference |
Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference |
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Notes |
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Approved |
no |
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Call Number |
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Serial |
1518 |
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