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Gol'tsman, G., Maslennikov, S., Finkel, M., Antipov, S., Kaurova, N., Grishina, E., et al. (2006). Nanostructured ultrathin NbN film as a terahertz hot-electron bolometer mixer. In Proc. MRS (Vol. 935, 210 (1 to 6)).
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Gershenzon, E. M., Gol'tsman, G. N., & Ptitsina, N. G. (1976). Investigation of free excitons in Ge and their condensation at submillimeter wavelengths. Sov. Phys. JETP, 43(1), 116–122.
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Tret'yakov, I. V., Kaurova, N. S., Voronov, B. M., Anfert'ev, V. A., Revin, L. S., Vaks, V. L., et al. (2016). The influence of the diffusion cooling on the noise band of the superconductor NbN hot-electron bolometer operating in the terahertz range. Tech. Phys. Lett., 42(6), 563–566.
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Smirnov, K. V., Vakhtomin, Y. B., Divochiy, A. V., Ozhegov, R. V., Pentin, I. V., & Gol'tsman, G. N. (2010). Infrared and terahertz detectors on basis of superconducting nanostructures. In IEEE (Ed.), Microwave and Telecom. Technol. (CriMiCo), 20th Int. Crimean Conf. (pp. 823–824).
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Kroug, M., Cherednichenko, S., Merkel, H., Kollberg, E., Voronov, B., Gol'tsman, G., et al. (2001). NbN hot electron bolometric mixers for terahertz receivers. IEEE Trans. Appl. Supercond., 11(1), 962–965.
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Ekström, H., Karasik, B., Kollberg, E., Gol'tsman, G., & Gershenzon, E. (1995). 350 GHz NbN hot electron bolometer mixer. In Proc. 6th Int. Symp. Space Terahertz Technol. (pp. 269–283).
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Reiger, E., Pan, D., Slysz, W., Jukna, A., Sobolewski, R., Dorenbos, S., et al. (2007). Spectroscopy with nanostructured superconducting single photon detectors. IEEE J. Select. Topics Quantum Electron., 13(4), 934–943.
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Korneev, A., Minaeva, O., Rubtsova, I., Milostnaya, I., Chulkova, G., Voronov, B., et al. (2005). Superconducting single-photon ultrathin NbN film detector. Quantum Electronics, 35(8), 698–700.
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Mehdi, I., Gol'tsman, G., & Putz, P. (2015). Introduction to the mini-special-issue on the 25th international symposium on space terahertz technology (ISSTT) (Vol. 5).
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Zhang, J., Boiadjieva, N., Chulkova, G., Deslandes, H., Gol'tsman, G. N., Korneev, A., et al. (2003). Noninvasive CMOS circuit testing with NbN superconducting single-photon detectors. Electron. Lett., 39(14), 1086–1088.
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