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Author Divochiy, Aleksander; Marsili, Francesco; Bitauld, David; Gaggero, Alessandro; Leoni, Roberto; Mattioli, Francesco; Korneev, Alexander; Seleznev, Vitaliy; Kaurova, Nataliya; Minaeva, Olga; Gol'tsman, Gregory; Lagoudakis, Konstantinos G.; Benkhaoul, Moushab; Lévy, Francis; Fiore, Andrea url  doi
openurl 
  Title Superconducting nanowire photon-number-resolving detector at telecommunication wavelengths Type Journal Article
  Year 2008 Publication Nat. Photon. Abbreviated Journal Nat. Photon.  
  Volume 2 Issue 5 Pages 302-306  
  Keywords SSPD, photon-number-resolving  
  Abstract (down) Optical-to-electrical conversion, which is the basis of the operation of optical detectors, can be linear or nonlinear. When high sensitivities are needed, single-photon detectors are used, which operate in a strongly nonlinear mode, their response being independent of the number of detected photons. However, photon-number-resolving detectors are needed, particularly in quantum optics, where n-photon states are routinely produced. In quantum communication and quantum information processing, the photon-number-resolving functionality is key to many protocols, such as the implementation of quantum repeaters1 and linear-optics quantum computing2. A linear detector with single-photon sensitivity can also be used for measuring a temporal waveform at extremely low light levels, such as in long-distance optical communications, fluorescence spectroscopy and optical time-domain reflectometry. We demonstrate here a photon-number-resolving detector based on parallel superconducting nanowires and capable of counting up to four photons at telecommunication wavelengths, with an ultralow dark count rate and high counting frequency.  
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  Notes Approved no  
  Call Number Serial 916  
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Author Elezov, M. S.; Ozhegov, R. V.; Kurochkin, Y. V.; Goltsman, G. N.; Makarov, V. S.; Samartsev, V. V.; Vinogradov, E. A.; Naumov, A. V.; Karimullin, K. R. url  doi
openurl 
  Title Countermeasures against blinding attack on superconducting nanowire detectors for QKD Type Conference Article
  Year 2015 Publication EPJ Web Conf. Abbreviated Journal EPJ Web Conf.  
  Volume 103 Issue Pages 10002 (1 to 2)  
  Keywords SSPD, SNSPD, QKD  
  Abstract (down) Nowadays, the superconducting single-photon detectors (SSPDs) are used in Quantum Key Distribution (QKD) instead of single-photon avalanche photodiodes. Recently bright-light control of the SSPD has been demonstrated. This attack employed a “backdoor” in the detector biasing technique. We developed the autoreset system which returns the SSPD to superconducting state when it is latched. We investigate latched state of the SSPD and define limit conditions for effective blinding attack. Peculiarity of the blinding attack is a long nonsingle photon response of the SSPD. It is much longer than usual single photon response. Besides, we need follow up response duration of the SSPD. These countermeasures allow us to prevent blind attack on SSPDs for Quantum Key Distribution.  
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  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 2100-014X ISBN Medium  
  Area Expedition Conference  
  Notes Approved no  
  Call Number Serial 1352  
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Author Zhang, J.; Pearlman, A.; Slysz, W.; Verevkin, A.; Sobolewski, R.; Okunev, O.; Korneev, A.; Kouminov, P.; Smirnov, K.; Chulkova, G.; Gol’tsman, G. N.; Lo, W.; Wilsher, K. url  openurl
  Title Infrared picosecond superconducting single-photon detectors for CMOS circuit testing Type Conference Article
  Year 2003 Publication CLEO/QELS Abbreviated Journal CLEO/QELS  
  Volume Issue Pages Cmv4  
  Keywords NbN SSPD; SNSPD; Infrared; Quantum detectors; Electron beam lithography; Infrared detectors; Infrared radiation; Quantum efficiency; Single photon detectors; Superconductors  
  Abstract (down) Novel, NbN superconducting single-photon detectors have been developed for ultrafast, high quantum efficiency detection of single quanta of infrared radiation. Our devices have been successfully implemented in a commercial VLSI CMOS circuit testing system.  
  Address  
  Corporate Author Thesis  
  Publisher Optical Society of America Place of Publication Editor  
  Language Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN ISBN Medium  
  Area Expedition Conference Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference  
  Notes Approved no  
  Call Number Serial 1518  
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Author Zinoni, C.; Alloing, B.; Li, L. H.; Marsili, F.; Fiore, A.; Lunghi, L.; Gerardino, A.; Vakhtomin, Y. B.; Smirnov, K. V.; Gol’tsman, G. N. url  openurl
  Title Single-photonics at telecom wavelengths using nanowire superconducting single photon detectors Type Conference Article
  Year 2007 Publication CLEO/QELS Abbreviated Journal CLEO/QELS  
  Volume Issue Pages QTuF6 (1 to 2)  
  Keywords SSPD, SNSPD  
  Abstract (down) Novel single-photon detectors based on NbN superconducting nanostructures promise orders-of- magnitude improvement over InGaAs APDs. We demonstrate this improved performance for the first time by measuring the g(2)(τ) on single photon states produced by a quantum dot at telecom wavelength.  
  Address  
  Corporate Author Thesis  
  Publisher Optical Society of America Place of Publication Editor  
  Language Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN ISBN Medium  
  Area Expedition Conference Conference on Lasers and Electro-Optics/Quantum Electronics and Laser Science Conference and Photonic Applications Systems Technologies  
  Notes Approved no  
  Call Number Zinoni:07 Serial 1432  
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Author Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. doi  openurl
  Title PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis Type Journal Article
  Year 2000 Publication Microelectronics Reliability Abbreviated Journal Microelectronics Reliability  
  Volume 40 Issue Pages 1353-1358  
  Keywords SSPD, CMOS testing  
  Abstract (down) Normal operation of complementary metal-oxide semiconductor (CMOS) devices entails the emission of picosecond pulses of light, which can be used to diagnose circuit problems. The pulses that are observed from submicron sized field effect transistors (FETs) are synchronous with logic state switching. Picosecond Imaging Circuit Analysis (PICA), a new optical imaging technique combining imaging with timing, spatially resolves individual devices at the 0.5 micron level and switching events on a 10 picosecond timescale. PICA is used here for the diagnostics of failures on two VLSI microprocessors.  
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  Corporate Author Thesis  
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  Language Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN ISBN Medium  
  Area Expedition Conference  
  Notes Approved no  
  Call Number Serial 1054  
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