Records |
Author |
Aksaev, E. E.; Gershenzon, E. M.; Gershenson, M. E.; Goltsman, G. N.; Semenov, A. D.; Sergeev, A. V. |
Title |
Prospects for using high-temperature superconductors to create electron bolometers |
Type |
Journal Article |
Year |
1989 |
Publication |
Pisma v Zhurnal Tekhnicheskoi Fiziki |
Abbreviated Journal |
Pisma v Zhurnal Tekhnicheskoi Fiziki |
Volume |
15 |
Issue |
14 |
Pages |
88-93 |
Keywords |
HTS HEB |
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Russian |
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0320-0116 |
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Перспективы применения высокотемпературных сверхпроводников для создания электронных болометров |
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Serial |
1693 |
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Author |
Годунова, Е. К.; Левин, В. И. |
Title |
Некоторые качественные вопросы теплопроводности |
Type |
Journal Article |
Year |
1966 |
Publication |
Ж. вычисл. матем. и матем. физ. |
Abbreviated Journal |
Ж. вычисл. матем. и матем. физ. |
Volume |
6 |
Issue |
6 |
Pages |
1097-1103 |
Keywords |
mathematics, temperature distribution, rod |
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Одногорбое распределение останется одногорбым; Duplicated as 1701 |
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no |
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Serial |
1700 |
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Author |
Gershenzon, E. M.; Gol'tsman, G. N.; Ptitsina, N. G. |
Title |
Observation of the free-exciton spectrum at submillimeter wavelengths |
Type |
Journal Article |
Year |
1972 |
Publication |
JETP Lett. |
Abbreviated Journal |
JETP Lett. |
Volume |
16 |
Issue |
4 |
Pages |
161-162 |
Keywords |
Ge, energy spectrum, free excitons |
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Serial |
1736 |
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Author |
Гершензон, Е. М.; Гольцман, Г. Н.; Елантьев, А. И.; Кагане, М. Л.; Мултановский, В. В.; Птицина, Н. Г. |
Title |
Применение субмиллиметровой ЛОВ спектроскопии для определения химической природы и концентрации примесей в чистых полупроводниках |
Type |
Journal Article |
Year |
1983 |
Publication |
Физика и техника полупроводников |
Abbreviated Journal |
Физика и техника полупроводников |
Volume |
17 |
Issue |
8 |
Pages |
1430-1437 |
Keywords |
BWO spectroscopy, pure semiconductors, residual impurities |
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Duplicated as 1714 |
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Serial |
1712 |
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Author |
Gershenson, E. M.; Gol'tsman, G. N.; Elant'ev, A. I.; Kagane, M. L.; Multanovskii, V. V.; Ptitsina, N. G. |
Title |
Use of submillimeter backward-wave tube spectroscopy in determination of the chemical nature and concentration of residual impurities in pure semiconductors |
Type |
Journal Article |
Year |
1983 |
Publication |
Sov. Phys. Semicond. |
Abbreviated Journal |
Sov. Phys. Semicond. |
Volume |
17 |
Issue |
8 |
Pages |
908-913 |
Keywords |
BWO spectroscopy, pure semiconductors, residual impurities |
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Применение субмиллиметровой ЛОВ спектроскопии для определения химической природы и концентрации примесей в чистых полупроводниках |
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no |
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Serial |
1714 |
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