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	Author	Гершензон, Е. М.; Гольцман, Г. Н.; Елантьев, А. И.; Кагане, М. Л.; Мултановский, В. В.; Птицина, Н. Г.
	Title	Применение субмиллиметровой ЛОВ спектроскопии для определения химической природы и концентрации примесей в чистых полупроводниках			Type	Journal Article
	Year	1983	Publication	Физика и техника полупроводников	Abbreviated Journal	Физика и техника полупроводников
	Volume	17	Issue	8	Pages	1430-1437
	Keywords	BWO spectroscopy, pure semiconductors, residual impurities
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	Corporate Author				Thesis
	Publisher		Place of Publication		Editor
	Language	Russian	Summary Language		Original Title
	Series Editor		Series Title		Abbreviated Series Title
	Series Volume		Series Issue		Edition
	ISSN		ISBN		Medium
	Area		Expedition		Conference
	Notes	Duplicated as 1714			Approved	no
	Call Number				Serial	1712
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