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Gershenzon, E. M., Gol'tsman, G. N., Emtsev, V. V., Mashovets, T. V., Ptitsyna, N. G., & Ryvkin, S. M. (1971). Role of impurities of groups III and V in the formation of defects following γ irradiation of germanium. JETP Lett., 14(6), 241.
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Гершензон, Е. М., Семенов, И. Т., & Фогельсон, М. С. (1985). Спин-решеточная релаксация доноров фосфора в кремнии при одноосной деформации образца. Физика и техника полупроводников, 19(9), 1696–1698.
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Банная, В. Ф., Веселова, Л. И., & Гершензон, Е. М. (1983). Об одном способе определения концентрации глубоких примесей в германии. Физика и техника полупроводников, 17(10), 1896–1898.
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Гершензон, Е. М., Литвак-Горская, Л. Б., & Рабинович, Р. И. (1983). Отрицательное магнитосопротивление в случае проводимости по верхней зоне Хаббарда. Физика и техника полупроводников, 17(10), 1873–1876.
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Гершензон, Е. М., Мельников, А. П., Рабинович, Р. И., & Смирнова, В. Б. (1983). О возможности создания инверсной функции распределения свободных носителей в полупроводниках при захвате на мелкие нейтральные примеси. Физика и техника полупроводников, 17(3), 499–501.
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Gershenzon, E. M., Gurvich, Y. A., Orlova, S. L., & Ptitsina, N. G. (1976). Scattering of electrons by charged impurities in Ge under cyclotron resonance conditions. Presumably: Sov. Phys. Semicond. | Физика и техника полупроводников, 10, 1379–1383.
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Gershenzon, E. M., Orlov, L. A., & Ptitsina, N. G. (1975). Absorption spectra in electron transitions between excited states of impurities in germanium. JETP Lett., 22(4), 95–97.
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Bondarenko, O. I., Gershenzon, E. M., Gurvich, Y. A., Orlova, S. L., & Ptitsina, N. G. (1972). Measurement of the width of the cyclotron resonance line of n-type Ge in quantizing magnetic fields. Presumably: Sov. Phys. Semicond. | Физика и техника полупроводников, 6, 362–363.
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Lobanov, Y. V., Vakhtomin, Y. B., Pentin, I. V., Khabibullin, R. A., Shchavruk, N. V., Smirnov, K. V., et al. (2018). Characterization of the THz quantum cascade laser using fast superconducting hot electron bolometer. EPJ Web Conf., 195, 04004 (1 to 2).
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Gershenzon, E. M., Gol'tsman, G. N., & Mirskii, G. I. (1987). Submillimeter backward-wave-tube spectrometer-relaxometer. Pribory i Tekhnika Eksperimenta, 30(4), 131–137.
Abstract: A backward-wave-tube (BWT) spectrometer-relaxometer is described that is designed for study of the relaxation characteristics of photoconductors in the wavelength range of 2-0.25 mm – in particular, to measure the relaxation times of the submillimeter photoconductivity of germanium in the range of 10[sup:-4]-10[sup:-9] sec and to determine from these data the concentration of compensating impurities of from 10[sup:10] to 10[sup:14] cm[sup:-3]. The instrument uses the beats of the oscillations of two BWTs and records the amplitude-frequency response of the specimen with variation of the beat frequency from 10[sup:4] to 10[sup:8] Hz with accumulation of the desired signal for less than or equal to1 sec by means of a quadrature synchronous detector. The beat frequency is stabilized and the quadrature voltages of the synchronous detector are formed by means of phase-locked loops.
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