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	Author	Банная, В. Ф.; Веселова, Л. И.; Гершензон, Е. М.
	Title	Об одном способе определения концентрации глубоких примесей в германии			Type	Journal Article
	Year	1983	Publication	Физика и техника полупроводников	Abbreviated Journal	Физика и техника полупроводников
	Volume	17	Issue	10	Pages	1896-1898
	Keywords	Ge, deep impurities
	Abstract
	Address
	Corporate Author				Thesis
	Publisher		Place of Publication		Editor
	Language		Summary Language		Original Title
	Series Editor		Series Title		Abbreviated Series Title
	Series Volume		Series Issue		Edition
	ISSN		ISBN		Medium
	Area		Expedition		Conference
	Notes				Approved	no
	Call Number				Serial	1762
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