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Ma, X. - S., Dakic, B., Naylor, W., Zeilinger, A., & Walther, P. (2011). Quantum simulation of the wavefunction to probe frustrated Heisenberg spin systems. Nat. Phys., 7(5), 399–405.
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Tang, L., Kocabas, S. E., Latif, S., Okyay, A. K., Ly-Gagnon, D. - S., Saraswat, K. C., et al. (2008). Nanometre-scale germanium photodetector enhanced by a near-infrared dipole antenna. Nature Photonics, 2, 226–229.
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-. (1996). ГОСТ Р 15.011-96. Патентные исследования. Содержание и порядок проведения.
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Julia Toussaint, R. G., Marco Schubert, Torsten May, Hans-Georg Meyer, Benjamin Dietzek, Jürgen Popp, Matthias Hofherr, Matthias Arndt, Dagmar Henrich, Konstantin Il'in, and Michael Siegel. (2012). Superconducting single-photon counting system for optical experiments requiring time-resolution in the picosecond range. AIP REVIEW OF SCIENTIFIC INSTRUMENTS, 83.
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Sahu, M., Bae, M. - H., Rogachev, A., Pekker, D., Wei, T. - C., Shah, N., et al. (2009). Individual topological tunnelling events of a quantum field probed through their macroscopic consequences. Nature Phys., 5, 503–508.
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-. (2008). ГОСТ 2.125-2008 ЕСКД Правила выполнения эскизных конструкторских документов.
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Kawamura, J., Blundell, R., Tong, C. - Y. E., Golts'man, G., Gershenzon, E., & Voronov B. (1996). Superconductive NbN hot-electron bolometric mixer performance at 250 GHz. In Proc. 7th Int. Symp. Space Terahertz Technol. (pp. 331–336).
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Kerr, A. R., Feldman, M. J., & Pan, S. - K. (1996). Receiver noise temperature, the quantum noise limit, and the role of the zero-point fluctuations. Electronics division internal report NO. 304, , 1–10.
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Lusche, R., Semenov, A., Huebers, H. - W., Ilin, K., Siegel, M., Korneeva, Y., et al. (2013). Effect of the wire geometry and an externally applied magnetic field on the detection efficiency of superconducting nanowire single-photon detectors. In INIS (Vol. 46, pp. 1–3).
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Shurakov, A., Tong, C. -yu E., Grimes, P., Blundell, R., & Golt'sman, G. (2015). A microwave reflection readout scheme for hot electron bolometric direct detector. IEEE Trans. THz Sci. Technol., 5, 81–84.
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