Home | << 1 >> |
Record | |||||
---|---|---|---|---|---|
Author | Банная, В. Ф.; Веселова, Л. И.; Гершензон, Е. М. | ||||
Title | Об одном способе определения концентрации глубоких примесей в германии | Type | Journal Article | ||
Year | 1983 | Publication | Физика и техника полупроводников | Abbreviated Journal | Физика и техника полупроводников |
Volume | 17 | Issue | 10 | Pages | 1896-1898 |
Keywords | Ge, deep impurities | ||||
Abstract | |||||
Address | |||||
Corporate Author | Thesis | ||||
Publisher | Place of Publication | Editor | |||
Language | Summary Language | Original Title | |||
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | ISBN | Medium | |||
Area | Expedition | Conference | |||
Notes | Approved | no | |||
Call Number | Serial | 1762 | |||
Permanent link to this record |