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Voevodin, E. I., Gershenzon, E. M., Goltsman, G. N., Ptitsina, N. G., & Chulkova, G. M. (1988). Capture of free holes by charged acceptors in uniaxially deformed Ge. Fizika i Tekhnika Poluprovodnikov, 22(3), 540–543.
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Gershenzon, E. M., Gol'tsman, G. N., & Mirskii, G. I. (1987). Submillimeter backward-wave-tube spectrometer-relaxometer. Pribory i Tekhnika Eksperimenta, 30(4), 131–137.
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Gershenzon, E. M., & Gol'tsman, G. N. (1988). Effect of electromagnetic radiation on a superconductor in a magnetic field. In Izv. Akad. Nauk SSSR, Seriya Fizicheskaya (Vol. 52, pp. 449–451).
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Gershenzon, E. M., Gol'tsman, G. N., Karasik, B. S., & Semenov, A. D. (1987). Measurement of the energy gap in the compound YBaCu3O9-δ on the basis of the IR absorption spectrum. JETP Lett., 46(5), 237–238.
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Gershenzon, Y. M., Goltsman, G. N., Yelantyev, A. I., Petrova, Y. B., Ptitsina, N. G., & Filatov, V. S. (1987). Lecture demonstrations of properties of superconductors and liquid helium. USSR Rept Phys. Math. JPRS UPM, 24(7), 51.
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Gol'tsman, G. N., Gusinskii, E. N., Malyavkin, A. V., Ptitsina, N. G., Selevko, A. G., & Edel'shtein, V. M. (1987). The excitonic Zeeman effect in uniaxially-strained germanium. Sov. Phys. JETP, 65(6), 1233–1241.
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Gershenzon, E. M., Gershenzon, M. E., Gol'tsman, G. N., Karasik, B. S., Semenov, A. D., & Sergeev, A. V. (1987). Light-induced heating of electrons and the time of the inelastic electron-phonon scattering in the YBaCuO compound. JETP Lett., 46(6), 285–287.
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Gershenzon, E. M., Gol'tsman, G. N., Ptitsina, N. G., & Riger, E. R. (1986). Effect of electron-electron collisions on the trapping of free carriers by shallow impurity centers in germanium. Sov. Phys. JETP, 64(4), 889–897.
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Gershenzon, E. M., Gol'tsman, G. N., & Ptitsina, N. G. (1972). Observation of the free-exciton spectrum at submillimeter wavelengths. JETP Lett., 16(4), 161–162.
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Гершензон, Е. М., Гольцман, Г. Н., Елантьев, А. И., Кагане, М. Л., Мултановский, В. В., & Птицина, Н. Г. (1983). Применение субмиллиметровой ЛОВ спектроскопии для определения химической природы и концентрации примесей в чистых полупроводниках. Физика и техника полупроводников, 17(8), 1430–1437.
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