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Hoevers, H. F. C.; Bento, A. C.; Bruijn, M. P.; Gottardi, L.; Korevaar, M. A. N.; Mels, W. A.; de Korte, P. A. J. Thermal fluctuation noise in a voltage biased superconducting transition edge thermometer 2000 Applied Physics Letters 77 4421-4424 details   openurl
Bennett, Douglas A.; Schmidt, Daniel R.; Swetz, Daniel S.; Ullom, Joel N. Phase-slip lines as a resistance mechanism in transition-edge sensors 2014 Appl. Phys. Lett. 104 042602 details   doi
Ryabchun, S.; Tong, C.-yu E.; Blundell, R.; Kimberk, R.; Gol’tsman, G. Effect of microwave radiation on the stability of terahertz hot-electron bolometer mixers 2006 Proc. SPIE 6373 63730J (1 to 5) details   doi
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