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	Author	Bennett, Douglas A.; Schmidt, Daniel R.; Swetz, Daniel S.; Ullom, Joel N.
	Title	Phase-slip lines as a resistance mechanism in transition-edge sensors			Type	Journal Article
	Year	2014	Publication	Appl. Phys. Lett.	Abbreviated Journal	Appl. Phys. Lett.
	Volume	104	Issue		Pages	042602
	Keywords	microbolometers, TES, phase-slip lines, PSL
	Abstract	The fundamental mechanism of resistance in voltage-biased superconducting films is poorly understood despite its importance as the basis of transition-edge sensors (TESs). TESs are utilized in state-of-the-art microbolometers and microcalorimeters covering a wide range of energies and applications. We present a model for the resistance of a TES based on phase-slip lines (PSLs) and compare the model to data. One of the model's predictions, discrete changes in the number of PSLs, is a possible explanation for the observed switching between discrete current states in localized regions of bias.
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	Notes	Recommended by Klapwijk			Approved	no
	Call Number				Serial	929
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