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Bennett, Douglas A.; Schmidt, Daniel R.; Swetz, Daniel S.; Ullom, Joel N. |
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Phase-slip lines as a resistance mechanism in transition-edge sensors |
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2014 |
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Appl. Phys. Lett. |
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Appl. Phys. Lett. |
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104 |
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042602 |
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microbolometers, TES, phase-slip lines, PSL |
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The fundamental mechanism of resistance in voltage-biased superconducting films is poorly understood despite its importance as the basis of transition-edge sensors (TESs). TESs are utilized in state-of-the-art microbolometers and microcalorimeters covering a wide range of energies and applications. We present a model for the resistance of a TES based on phase-slip lines (PSLs) and compare the model to data. One of the model's predictions, discrete changes in the number of PSLs, is a possible explanation for the observed switching between discrete current states in localized regions of bias. |
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Recommended by Klapwijk |
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no |
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929 |
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Steudle, Gesine A.; Schietinger, Stefan; Höckel, David; Dorenbos, Sander N.; Zadeh, Iman E.; Zwiller, Valery; Benson, Oliver |
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Measuring the quantum nature of light with a single source and a single detector |
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Journal Article |
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2012 |
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Phys. Rev. A |
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86 |
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5 |
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053814 |
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SSPD, SNSPD, saturation count rates, dead time, dynamic range |
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An elementary experiment in optics consists of a light source and a detector. Yet, if the source generates nonclassical correlations such an experiment is capable of unambiguously demonstrating the quantum nature of light. We realized such an experiment with a defect center in diamond and a superconducting detector. Previous experiments relied on more complex setups, such as the Hanbury Brown and Twiss configuration, where a beam splitter directs light to two photodetectors, creating the false impression that the beam splitter is a fundamentally required element. As an additional benefit, our results provide a simplification of the widely used photon-correlation techniques. |
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American Physical Society |
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1089 |
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