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Gershenson, E. M.; Gol'tsman, G. N.; Elant'ev, A. I.; Kagane, M. L.; Multanovskii, V. V.; Ptitsina, N. G. Use of submillimeter backward-wave tube spectroscopy in determination of the chemical nature and concentration of residual impurities in pure semiconductors 1983 Sov. Phys. Semicond. 17 908-913 details   url
Semenov, A. D.; Gol’tsman, G. N.; Gogidze, I. G.; Sergeev, A. V.; Gershenzon, E. M.; Lang, P. T.; Renk, K. F. Subnanosecond photoresponse of a YBaCuO thin film to infrared and visible radiation by quasiparticle induced suppression of superconductivity 1992 Appl. Phys. Lett. 60 903-905 details   doi
Gershenzon, E. M.; Gol'tsman, G. N.; Ptitsina, N. G.; Riger, E. R. Effect of electron-electron collisions on the trapping of free carriers by shallow impurity centers in germanium 1986 Sov. Phys. JETP 64 889-897 details   url
Finkel, M. I.; Maslennikov, S. N.; Gol'tsman, G. N. Terahertz heterodyne receivers based on superconductive hot-electron bolometer mixers 2005 Radiophys. Quant. Electron. 48 859-864 details   doi
Il'in, K. S.; Karasik, B. S.; Ptitsina, N. G.; Sergeev, A. V.; Gol'tsman, G. N.; Gershenzon, E. M.; Pechen, E. V.; Krasnosvobodtsev, S. I. Electron-phonon-impurity interference in thin NbC films: electron inelastic scattering time and corrections to resistivity 1996 Czech. J. Phys. 46 857-858 details   doi
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