|
Author |
Title |
Year |
Publication |
Volume |
Pages |
Links |
|
Hoevers, H. F. C.; Bento, A. C.; Bruijn, M. P.; Gottardi, L.; Korevaar, M. A. N.; Mels, W. A.; de Korte, P. A. J. |
Thermal fluctuation noise in a voltage biased superconducting transition edge thermometer |
2000 |
Applied Physics Letters |
77 |
4421-4424 |
|
|
Galeazzi, Massimiliano |
Fundamental noise processes in TES devices |
2011 |
IEEE Trans. Appl. Supercond. |
21 |
267-271 |
|
|
Bennett, Douglas A.; Schmidt, Daniel R.; Swetz, Daniel S.; Ullom, Joel N. |
Phase-slip lines as a resistance mechanism in transition-edge sensors |
2014 |
Appl. Phys. Lett. |
104 |
042602 |
|
|
Titova, N; Kardakova, A.; Tovpeko, N; Ryabchun, S.; Mandal, S.; Morozov, D.; Klemencic, G. M.; Giblin, S.R.; Williams, O. A.; Goltsman, G. N. |
Superconducting diamond films as perspective material for direct THz detectors |
2017 |
Proc. 28th Int. Symp. Space Terahertz Technol. |
|
82 |
|
|
Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. |
PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis |
2000 |
Microelectronics Reliability |
40 |
1353-1358 |
|