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Bennett, D. A., Schmidt, D. R., Swetz, D. S., & Ullom, J. N. (2014). Phase-slip lines as a resistance mechanism in transition-edge sensors. Appl. Phys. Lett., 104, 042602.
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Swetz, D. S., Bennett, D. A., Irwin, K. D., Schmidt, D. R., & Ullom, J. N. (2012). Current distribution and transition width in superconducting transition-edge sensors. Appl. Phys. Lett., 101, 242603.
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Miao, W., Zhang, W., Zhong, J. Q., Shi, S. C., Delorme, Y., Lefevre, R., et al. (2014). Non-uniform absorption of terahertz radiation on superconducting hot electron bolometer microbridges. <ef><bf><bc>Appl. Phys. Lett., 104, 052605(1–4).
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Kardakova, A., Finkel, M., Morozov, D., Kovalyuk, V., An, P., Dunscombe, C., et al. (2013). The electron-phonon relaxation time in thin superconducting titanium nitride films. Appl. Phys. Lett., 103(25), 252602 (1 to 4).
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Gousev, Y. P., Semenov, A. D., Pechen, E. V., Varlashkin, A. V., Nebosis, R. S., & Renk K. F. (1996). Coupling of terahertz radiation to a high-Т(с) superconducting hot electron bolometer mixer. Appl. Phys. Lett.,, 69, 691–693.
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Floet D. W., Gao J. R., Klapwijk T. M., & de Korte P. A. J. (2000). Bias Dependence of the Thermal Time Constant in Nb Superconducting Diffusion-Cooled HEB Mixers. Appl. Phys. Lett., 77, 1719.
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Tarkhov, M., Claudon, J., Poizat, J. P., Korneev, A., Divochiy, A., Minaeva, O., et al. (2008). Ultrafast reset time of superconducting single photon detectors. Appl. Phys. Lett., 92(24), 241112 (1 to 3).
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Hadfield, R. H., Habif, J. L., Schlafer, J., Schwall, R. E., & Nam, S. W. (2006). Quantum key distribution at 1550 nm with twin superconducting single-photon detectors. Appl. Phys. Lett., 89(24), 241129.
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Delacour, C., Claudon, J., Poizat, J. - P., Pannetier, B., Bouchiat, V., de Lamaestre, R. E., et al. (2007). Superconducting single photon detectors made by local oxidation with an atomic force microscope. Appl. Phys. Lett., 90(19), 191116 (1 t0 3).
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Lindgren, M., Zorin, M. A., Trifonov, V., Danerud, M., Winkler, D., Karasik, B. S., et al. (1994). Optical mixing in a patterned YBa2Cu3O7-δ thin film. Appl. Phys. Lett., 65(26), 3398–3400.
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