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Author Engel, Andreas; Aeschbacher, Adrian; Inderbitzin, Kevin; Schilling, Andreas; Il'in, Konstantin; Hofherr, Matthias; Siegel, Michael; Semenov, Alexei; Hübers, Heinz-Wilhelm openurl 
  Title Tantalum nitride superconducting single-photon detectors with low cut-off energy Type Journal Article
  Year 2011 Publication arXiv Abbreviated Journal arXiv  
  Volume Issue Pages 9  
  Keywords SSPD  
  Abstract Materials with a small superconducting energy gap favor a high detection efficiency of low-energy photons in superconducting nanowire single-photon detectors. We developed a TaN detector with smaller gap and lower density of states at the Fermi energy than in comparable NbN devices, while other relevant parameters remain essentially unchanged. This results in a reduction of the minimum photon energy required for direct detection to $\approx1/3$ as compared to NbN.  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication arXiv:1110.4576 Editor  
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  Area Expedition Conference  
  Notes Approved no  
  Call Number RPLAB @ gujma @ Serial 687  
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Author Bulaevskii, L. N.; Graf, M. J.; Batista, C. D.; Kogan, V. G. openurl 
  Title Vortex-induced dissipation in narrow current-biased thin-film superconducting strips Type Journal Article
  Year 2011 Publication Phys. Rev. B Abbreviated Journal Phys. Rev. B  
  Volume 83 Issue 14 Pages 9  
  Keywords  
  Abstract A vortex crossing a thin-film superconducting strip from one edge to the other, perpendicular to the bias current, is the dominant mechanism of dissipation for films of thickness d on the order of the coherence length ξ and of width w much narrower than the Pearl length Λâ‰<ab>wâ‰<ab>ξ. At high bias currents I*<I<Ic the heat released by the crossing of a single vortex suffices to create a belt-like normal-state region across the strip, resulting in a detectable voltage pulse. Here Ic is the critical current at which the energy barrier vanishes for a single vortex crossing. The belt forms along the vortex path and causes a transition of the entire strip into the normal state. We estimate I* to be roughly Ic/3. Furthermore, we argue that such “hot” vortex crossings are the origin of dark counts in photon detectors, which operate in the regime of metastable superconductivity at currents between I* and Ic. We estimate the rate of vortex crossings and compare it with recent experimental data for dark counts. For currents below I*, that is, in the stable superconducting but resistive regime, we estimate the amplitude and duration of voltage pulses induced by a single vortex crossing.  
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  Area Expedition Conference  
  Notes SSPD Approved no  
  Call Number RPLAB @ gujma @ Serial 688  
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Author Dorenbos, S. N.; Heeres, R.W.; Driessen, E.F.C; Zwiller, V. openurl 
  Title Efficient and robust fiber coupling of superconducting single photon detectors Type Journal Article
  Year 2011 Publication arXiv Abbreviated Journal arXiv  
  Volume Issue Pages 6  
  Keywords SSPD  
  Abstract We applied a recently developed fiber coupling technique to superconducting single photon detectors (SSPDs). As the detector area of SSPDs has to be kept as small as possible, coupling to an optical fiber has been either inefficient or unreliable. Etching through the silicon substrate allows fabrication of a circularly shaped chip which self aligns to the core of a ferrule terminated fiber in a fiber sleeve. In situ alignment at cryogenic temperatures is unnecessary and no thermal stress during cooldown, causing misalignment, is induced. We measured the quantum efficiency of these devices with an attenuated tunable broadband source. The combination of a lithographically defined chip and high precision standard telecommunication components yields near unity coupling efficiency and a system detection efficiency of 34% at a wavelength of 1200 nm. This quantum efficiency measurement is confirmed by an absolute efficiency measurement using correlated photon pairs (with $\lambda$ = 1064 nm) produced by spontaneous parametric down-conversion. The efficiency obtained via this method agrees well with the efficiency measured with the attenuated tunable broadband source.  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication arXiv:1109.5809 Editor  
  Language Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
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  Area Expedition Conference  
  Notes Approved no  
  Call Number RPLAB @ gujma @ Serial 689  
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Author Venkatasubramanian, Chandrasekaran; Cabarcos, Orlando M.; Allara, David L. Horn, Mark W.; Ashok, S. openurl 
  Title Correlation of temperature response and structure of annealed VOx thin films for IR detector applications Type Journal Article
  Year 2009 Publication J. Vac. Sci. Technol. A Abbreviated Journal  
  Volume 27 Issue 4 Pages 6  
  Keywords Annealing  
  Abstract The effects of thermal annealing on vanadium oxide (VOx) thin films prepared by pulsed-dc magnetron sputtering were studied to explore methods of improving the efficiency of uncooled IR imaging microbolometers, particularly with respect to maximizing the temperature coefficients of resistance (TCR) (typically ~2%) while minimizing resistivity values (typically 0.05–5 Ω cm). Since high TCR values are usually associated with high resistivities, the experiments were designed to find processing conditions that provide an optimal balance in these properties and to then determine the underlying structural correlations which would enable rational design of thin films for this specific application. VOx films of different compositions were deposited by pulsed-dc reactive sputtering from a vanadium target at different oxygen flow rates. The deposited films were further modified by annealing in inert (nitrogen) and oxidizing (oxygen) atmospheres at four different temperatures for 10, 20, or 30 min at a time. The resistivities of the as-deposited films ranged from 0.2 to 13 Ω cm and the TCR values varied from –1.6% to –2.2%. Depending on the exact annealing conditions, several orders of magnitude change in resistance and significant variations in TCR were observed. Optimal results were obtained with annealing in a nitrogen atmosphere. Structural characterization by x-ray diffraction, field emission scanning electron microscopy, atomic force microscopy, and Raman spectroscopy indicated changes in the film crystallinity and phase for annealing conditions over 300 °C with the onset and extent of the changes dependent on which annealing atmosphere was used.  
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  Notes Annealing Approved no  
  Call Number RPLAB @ gujma @ Serial 690  
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Author Mannino, Giovanni; Spinella, Corrado; Ruggeri, Rosa; La Magna, Antonino; Fisicaro, Giuseppe; Fazio, Enza; Neri, Fortunato; Privitera, Vittorio openurl 
  Title Crystallization of implanted amorphous silicon during millisecond annealing by infrared laser irradiation Type Journal Article
  Year 2010 Publication Applied Physics Letters Abbreviated Journal Appl. Phys. Lett.  
  Volume 97 Issue 2 Pages 3  
  Keywords Annealing  
  Abstract We investigated the homogenous nucleation of crystalline grains in amorphous Si during transient temperature pulse of few milliseconds IR laser irradiation. The crystallized volume fraction is ~80%. Significant crystallization occurs in nonsteady regime because of the rapid temperature variation (106 °C/s). Our model combines the time evolution of the crystal grain population with the consumption of the amorphous volume due to the growth of grains. Thanks to the experimental approach based on a laser source to heat α-Si and the theoretical model we extended the description of the spontaneous crystallization up to 1323 K or 250 K above the temperature investigated by conventional annealing.  
  Address  
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  Publisher Place of Publication Editor  
  Language Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN (up) ISBN Medium  
  Area Expedition Conference  
  Notes Annealing Approved no  
  Call Number RPLAB @ gujma @ Serial 691  
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