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Шангина, Е. Л.; Смирнов, К. В.; Морозов, Д. В.; Ковалюк, В. В.; Гольцман, Г. Н.; Веревкин, А. А.; Торопов, А. И. |
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Концентрационная зависимость полосы преобразования смесителей субмиллиметрового диапазона на основе наноструктур AlGaAs/GaAs |
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2010 |
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Изв. РАН Сер. Физ. |
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Изв. РАН Сер. Физ. |
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74 |
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1 |
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110-112 |
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2DEG AlGaAs/GaAs heterostructures, THz heterodyne detectors, IF bandwidth |
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Методом субмиллиметровой спектроскопии с высоким временным разрешением при Т = 4.2 К измерена концентрационная зависимость полосы преобразования гетеродинного детектирования гетероструктур AlGaAs/GaAs с двумерным электронным газом. С увеличением концентрации двумерных электронов ns = (1.6–6.6) · 1011см-2 ширина полосы преобразования f3dB уменьшается от 245 до 145 МГц. В исследованной области концентраций наблюдается зависимость f3dB , обусловленная рассеянием электронов на деформационном потенциале акустических фононов и пьезоэлектрическим рассеянием. |
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Duplicated as 1217 |
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RPLAB @ gujma @ |
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642 |
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Shangina, E. L.; Smirnov, K. V.; Morozov, D. V.; Kovalyuk, V. V.; Gol’tsman, G. N.; Verevkin, A. A.; Toropov, A. I. |
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Concentration dependence of the intermediate frequency bandwidth of submillimeter heterodyne AlGaAs/GaAs nanostructures |
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2010 |
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Bull. Russ. Acad. Sci. Phys. |
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Bull. Russ. Acad. Sci. Phys. |
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74 |
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1 |
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100-102 |
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2DEG AlGaAs/GaAs heterostructures, THz heterodyne detectors, IF bandwidth |
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The concentration dependence of the intermediate frequency bandwidth of heterodyne AlGaAs/GaAs detectors with 2D electron gas is measured using submillimeter spectroscopy with high time resolution at T= 4.2 K. The intermediate frequency bandwidth f3dBfalls from 245 to 145 MHz with increasing concentration of 2D electrons n s = (1.6-6.6) × 10[su11] cm-2. The dependence f3dB ≈ n s – 0.04±is observed in the studied concentration range; this dependence is determined by electron scattering by the deformation potential of acoustic phonons and piezoelectric scattering. |
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1062-8738 |
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Шангина, Е. Л.; Смирнов, К. В.; Морозов, Д. В.; Ковалюк, В. В.; Гольцман, Г. Н.; Веревкин, А. А.; Торопов, А. И. |
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Полоса и потери преобразования полупроводникового смесителя с фононным каналом охлаждения двумерных электронов |
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2010 |
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Физика и техника полупроводников |
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44 |
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11 |
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1475-1478 |
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2DEG, AlGaAs/GaAs heterostructures mixers |
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Методом субмиллиметровой спектроскопии с высоким временным разрешением измерены температурная и концентрационная зависимости полосы преобразования смесителей терагерцового диапазона AlGaAs/GaAs на разогреве двумерных электронов с фононным каналом их охлаждения. Полоса преобразования на уровне 3 дБ (f3 dB) при 4.2 K при изменении концентрации ns варьируется в пределах 150-250 МГц в соответствии со степенным законом f3 dB propto ns-0.5, что соответствует доминирующему механизму рассеяния на пьезоэлектрических фононах. Минимальное значение коэффициента потерь преобразования полупроводникового смесителя достигается в структурах с высокой подвижностью носителей mu>3·105 см2/В·с при 4.2 K. |
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Duplicated as 1216 |
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RPLAB @ gujma @ |
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702 |
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Shangina, E. L.; Smirnov, K. V.; Morozov, D. V.; Kovalyuk, V. V.; Gol’tsman, G. N.; Verevkin, A. A.; Toropov, A. I. |
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Frequency bandwidth and conversion loss of a semiconductor heterodyne receiver with phonon cooling of two-dimensional electrons |
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2010 |
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Semicond. |
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Semicond. |
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44 |
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11 |
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1427-1429 |
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2DEG, AlGaAs/GaAs heterostructures mixers |
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The temperature and concentration dependences of the frequency bandwidth of terahertz heterodyne AlGaAs/GaAs detectors based on hot electron phenomena with phonon cooling of two-dimensional electrons have been measured by submillimeter spectroscopy with a high time resolution. At a temperature of 4.2 K, the frequency bandwidth at a level of 3 dB (f 3 dB) is varied from 150 to 250 MHz with a change in the concentration n s according to the power law f 3dB ∝ n −0.5 s due to the dominant contribution of piezoelectric phonon scattering. The minimum conversion loss of the semiconductor heterodyne detector is obtained in structures with a high carrier mobility (μ > 3 × 105 cm2 V−1 s−1 at 4.2 K). |
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1063-7826 |
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Полоса и потери преобразования полупроводникового смесителя с фононным каналом охлаждения двумерных электронов |
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1216 |
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Mannino, Giovanni; Spinella, Corrado; Ruggeri, Rosa; La Magna, Antonino; Fisicaro, Giuseppe; Fazio, Enza; Neri, Fortunato; Privitera, Vittorio |
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Crystallization of implanted amorphous silicon during millisecond annealing by infrared laser irradiation |
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2010 |
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Applied Physics Letters |
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Appl. Phys. Lett. |
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97 |
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2 |
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3 |
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Annealing |
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We investigated the homogenous nucleation of crystalline grains in amorphous Si during transient temperature pulse of few milliseconds IR laser irradiation. The crystallized volume fraction is ~80%. Significant crystallization occurs in nonsteady regime because of the rapid temperature variation (106 °C/s). Our model combines the time evolution of the crystal grain population with the consumption of the amorphous volume due to the growth of grains. Thanks to the experimental approach based on a laser source to heat α-Si and the theoretical model we extended the description of the spontaneous crystallization up to 1323 K or 250 K above the temperature investigated by conventional annealing. |
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RPLAB @ gujma @ |
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691 |
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Jang, Young Rae; Yoo, Keon-Ho; Park, Seung Min |
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Rapid thermal annealing of ZnO thin films grown at room temperature |
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2010 |
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J. Vac. Sci. Technol. A |
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28 |
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2 |
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4 |
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Annealing |
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The authors successfully obtained high quality ZnO thin films by growing them at room temperature (RT) and postannealing by rapid thermal annealing (RTA). The thin films were grown by pulsed laser deposition on Si (100) substrates at RT, and RTA was performed under various temperatures and ambient conditions. Based on the UV emission to visible emission ratio in RT photoluminescence (PL) spectra, the optimum film was obtained at annealing temperature ~700 °C in an ambient of Ar, N2, or O2 at 0.1 Torr, while the optimum annealing temperature was above 1100 °C in the air ambient at atmospheric pressure. The morphology and structure of the films in different RTA conditions were investigated by using field emission scanning electron microscopy and grazing incidence x-ray diffraction, and were discussed in conjunction with the PL data. |
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Annealing |
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RPLAB @ gujma @ |
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692 |
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O'Neal, Claire |
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A project guide to rocks and minerals |
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Book Whole |
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2010 |
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Mitchell Lane Publishers |
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1-47 |
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children |
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Churikov, Victor M.; Kopp, Victor I.; Genack, Azriel Z. |
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Chiral diffraction gratings in twisted microstructured fibers |
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2010 |
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Optics Letters |
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Opt. Lett. |
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35 |
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3 |
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342-344 |
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chiral diffracion gratings, optical fiber gratings, from chiralphotonics |
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We observed dips in transmission spectra of uniformly twisted pure-silica microstructured fibers. The spectral positions of the dips and their insensitivity to the surrounding medium are consistent with Bragg diffraction from the helical structure. The reproducibility of the variation of the dip wavelength with temperature up to 1000°C makes the chiral diffraction grating suitable for high-temperature sensing. |
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853 |
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Hoeffgen, S.K.; Kuhnhenn, J.; Weinand, U. |
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High radiation sensitivity of chiral long period gratings |
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2010 |
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IEEE Trans. Nucl. Sci. |
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57 |
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5 |
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2915 - 2922 |
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chiral fiber gratings, chiral gratings, chiral LPG, from chiralphotonics |
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The radiation sensitivity of chiral long period gratings was investigated for the first time. After a Co-60 gamma dose of 100 kGy they show radiation-induced changes of their transmission dip wavelength of up to 10 nm, which is 100 to 1000 times higher than the radiation-induced wavelength shift of different fiber Bragg grating types. They can therefore be used as radiation sensors down to doses of 10 Gy or even below, but not for accurate dose measurements since the size of the wavelength shift after a certain dose still depends on the radiation dose rate. Chiral gratings made of eight single mode fiber types with differences of their radiation-induced attenuation of several orders of magnitude were investigated in order to look for a correlation between dip wavelength shift and fiber attenuation. However, the dip wavelength curves do not show exactly the same order as the fiber attenuation curves. A theory that can exactly predict all properties of the chiral gratings might enable us to specify from our results an optimized fiber for the production of gratings that can also be used for radiation dosimetry. |
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848 |
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Tikhonov, V. V.; Boyarskii, D. A.; Polyakova, O. N.; Dzardanov, A. L.; Goltsman, G. N. |
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Radiophysical and dielectric properties of ore minerals in 12--145 GHz frequency range |
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2010 |
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PIER B |
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PIER B |
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25 |
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349-367 |
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complex permittivity, ore minerals |
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The paper discusses a retrieval technique of complex permittivity of ore minerals in frequency ranges of 12--38 GHz and 77--145 GHz. The method is based on measuring frequency dependencies of transmissivity and reflectivity of plate-parallel mineral samples. In the 12--38 GHz range, the measurements were conducted using a panoramic standing wave ratio and attenuation meter. In the 77--145 GHz range, frequency dependencies of transmissivity and reflectivity were obtained using millimeter-band spectrometer with backward-wave oscillators. The real and imaginary parts of complex permittivity of a mineral were determined solving an equation system for frequency dependencies of transmissivity and reflectivity of an absorbing layer located between two dielectric media. In the course of the work, minerals that are primary ores in iron, zinc, copper and titanium mining were investigated: magnetite, hematite, sphalerite, chalcopyrite, pyrite, and ilmenite. |
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