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Wiechers, C., Lydersen, L., Wittmann, C., Elser, D., Skaar, J., Marquardt, C., et al. (2011). After-gate attack on a quantum cryptosystem. New J. Phys., 13(1), 14.
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Lydersen, L., Wiechers, C., Wittmann, C., Elser, D., Skaar, J., & Makarov, V. (2010). Thermal blinding of gated detectors in quantum cryptography. Opt. Express, 18(26), 27938–27954.
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Gupta, D., & Kadin, A. M. (1999). Single-photon-counting hotspot detector with integrated RSFQ readout electronics. IEEE Trans. Appl. Supercond., 9(2), 4487–4490.
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Annunziata, A. J., Quaranta, O., Santavicca, D. F., Casaburi, A., Frunzio, L., Ejrnaes, M., et al. (2010). Reset dynamics and latching in niobium superconducting nanowire single-photon detectors. J. Appl. Phys., 108(8), 7.
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Baek, B., Lita, A. E., Verma, V., & Nam, S. W. (2011). Superconducting a-WxSi1–x nanowire single-photon detector with saturated internal quantum efficiency from visible to 1850 nm. Appl. Phys. Lett., 98(25), 3.
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Tanner, M. G., Natarajan, C. M., Pottapenjara, V. K., O'Connor, J. A., Warburton, R. J., Hadfield, R. H., et al. (2010). Enhanced telecom wavelength single-photon detection with NbTiN superconducting nanowires on oxidized silicon. Appl. Phys. Lett., 96(22), 3.
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Yamashita, T., Miki, S., Qiu, W., Fujiwara, M., Sasaki, M., & Wang, Z. (2010). Temperature dependent performances of superconducting nanowire single-photon detectors in an ultralow-temperature region. IEEE Trans. Appl. Supercond., 21(3), 336–339.
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Marsili, F., Najafi, F., Dauler, E., Bellei, F., Hu, X., Csete, M., et al. (2011). Single-photon detectors based on ultranarrow superconducting nanowires. Nano Lett., 11(5), 2048–2053.
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Yang, J. K. W., Kerman, A. J., Dauler, E. A., Cord, B., Anant, V., Molnar, R. J., et al. (2009). Suppressed critical current in superconducting nanowire single-photon detectors with high fill-factors. IEEE Trans. Appl. Supercond., 19(3), 318–322.
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Hu, X., Zhong, T., White, J. E., Dauler, E. A. N., Faraz, Herder, C. H., Wong, F. N. C., et al. (2009). Fiber-coupled nanowire photon counter at 1550 nm with 24% system detection efficiency. Opt. Lett., 34(23), 3607–3609.
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