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Author Trifonov, Andrey; Tong, C. Edward; Lobanov, Yury; Kaurova, Natalia; Blundell, Raymond; Gol’tsman, Gregory url  openurl
  Title An investigation of the DC and IF performance of silicon-membrane HEB mixer elements Type Conference Article
  Year 2015 Publication Proc. 26th Int. Symp. Space Terahertz Technol. Abbreviated Journal Proc. 26th Int. Symp. Space Terahertz Technol.  
  Volume Issue Pages 40  
  Keywords (down) silicon-membrane HEB waveguide mixer  
  Abstract We report on our initial development towards a 2x2 multi-pixel HEB waveguide mixer for operation at 1.4 THz. We have successfully fabricated devices comprising an NbN bridge integrated with antenna test structure using a silicon membrane as the supporting substrate. DC measurements of the test chips demonstrate critical current from 0.1 – 1mA depending on the size of device, with T c of around 10 K and ΔTc ~ 0.8 K.  
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  Call Number Serial 1160  
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Author Гершензон, Е. М.; Семенов, И. Т.; Фогельсон, М. С. url  openurl
  Title О механизме динамического сужения линии ЭПР доноров фосфора в кремнии Type Journal Article
  Year 1984 Publication Физика и техника полупроводников Abbreviated Journal Физика и техника полупроводников  
  Volume 18 Issue 3 Pages 421-425  
  Keywords (down) Si, phosphorus donors, EPR  
  Abstract Температурная зависимость ширины линии ЭПР доноров Р в Si исследована в интервале концентрации ND=2.5⋅1017−9⋅1017см−3 и температур T=1.7−45 K на образцах с различной степенью компенсации основной примеси. Результаты согласуются с моделью обменного сужения линии при учете температурной зависимости обменного интеграла и тем самым исключают предлагавшийся ранее механизм сужения линии вследствие прыжкового движения электронов по примесным центрам.  
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  Call Number Serial 1761  
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Author Гершензон, Е. М.; Мельников, А. П.; Рабинович, Р. И.; Смирнова, В. Б. url  openurl
  Title О возможности создания инверсной функции распределения свободных носителей в полупроводниках при захвате на мелкие нейтральные примеси Type Journal Article
  Year 1983 Publication Физика и техника полупроводников Abbreviated Journal Физика и техника полупроводников  
  Volume 17 Issue 3 Pages 499-501  
  Keywords (down) shallow neutral impurities, capture, inverse distribution function, Si  
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  Call Number Serial 1764  
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Author Gershenzon, E. M.; Gol'tsman, G. N.; Ptitsina, N. G. url  openurl
  Title Submillimeter spectroscopy of semiconductors Type Journal Article
  Year 1973 Publication Sov. Phys. JETP Abbreviated Journal Sov. Phys. JETP  
  Volume 37 Issue 2 Pages 299-304  
  Keywords (down) semiconductors, submillimeter spectroscopy, spectrometer, BWO, Ge, free excitons  
  Abstract The possibility is considered of carrying out submillimeter-wave spectral investigations of semiconductors by means of a high resolution spectrometer with backward-wave tubes. Results of a study of the excitation spectra of small impurities, D-(A +) centers and free excitons in germanium are presented.  
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  Call Number Serial 1735  
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Author Rasulova, G. K.; Brunkov, P. N.; Pentin, I. V.; Egorov, A. Y.; Knyazev, D. A.; Andrianov, A. V.; Zakhar’in, A. O.; Konnikov, S. G.; Gol’tsman, G. N. url  doi
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  Title A weakly coupled semiconductor superlattice as a potential for a radio frequency modulated terahertz light emitter Type Journal Article
  Year 2012 Publication Appl. Phys. Lett. Abbreviated Journal Appl. Phys. Lett.  
  Volume 100 Issue 13 Pages 131104 (1 to 4)  
  Keywords (down) semiconductor superlattice  
  Abstract The bolometer response to THz radiation from a weakly coupled GaAs/AlGaAs superlattice biased in the self-oscillations regime has been observed. The bolometer signal is modulated with the frequency equal to the fundamental frequency of superlattice self-oscillations. The frequency spectrum of the bolometer signal contains higher harmonics whose frequency is a multiple of fundamental frequency of self-oscillations.

This work was supported by State Contracts Nos. 16.740.11.0044 and 16.552.11.7002 of Ministry of Education and Science of the Russian Federation. Structural characterization was made on the equipment of the Joint Research Centre «Material science and characterization in advanced technology» (Ioffe Institute, St. Petersburg, Russia).
 
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  ISSN 0003-6951 ISBN Medium  
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  Notes Approved no  
  Call Number Serial 1379  
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