| |
Author |
Title |
Year |
Publication |
Volume |
Pages |
Links |
|
|
Chulcova, G. M.; Ptitsina, N. G.; Gershenzon, E. M.; Gershenzon, M. E.; Sergeev, A. V. |
Effect of the interference between electron-phonon and electron-impurity (boundary) scattering on resistivity Nb, Al, Be films |
1996 |
Czech J. Phys. |
46 |
2489-2490 |
|
|
|
Maslennikov, S. N.; Morozov, D. V.; Ozhegov, R. V.; Smirnov, K. V.; Okunev, O. V.; Gol’tsman, G. N. |
Imaging system for submillimeter wave range based on AlGaAs/GaAs hot electron bolometer mixers |
2004 |
Proc. 5-th MSMW |
2 |
558-560 |
|
|
|
Shangina, E. L.; Smirnov, K. V.; Morozov, D. V.; Kovalyuk, V. V.; Goltsman, G. N.; Verevkin, A. A.; Toropov, A. I.; Mauskopf, P. |
Concentration dependence of energy relaxation time in AlGaAs/GaAs heterojunctions: direct measurements |
2011 |
Semicond. Sci. Technol. |
26 |
025013 |
|
|
|
Venkatasubramanian, Chandrasekaran; Cabarcos, Orlando M.; Allara, David L. Horn, Mark W.; Ashok, S. |
Correlation of temperature response and structure of annealed VOx thin films for IR detector applications |
2009 |
J. Vac. Sci. Technol. A |
27 |
6 |
|
|
|
Mannino, Giovanni; Spinella, Corrado; Ruggeri, Rosa; La Magna, Antonino; Fisicaro, Giuseppe; Fazio, Enza; Neri, Fortunato; Privitera, Vittorio |
Crystallization of implanted amorphous silicon during millisecond annealing by infrared laser irradiation |
2010 |
Applied Physics Letters |
97 |
3 |
|
