| |
Author |
Title |
Year |
Publication |
Volume |
Pages |
Links |
|
|
Il'in, K. S.; Verevkin, A. A.; Gol'tsman, G. N.; Sobolewski, R. |
Infrared hot-electron NbN superconducting photodetectors for imaging applications |
1999 |
Supercond. Sci. Technol. |
12 |
755-758 |
|
|
|
Il'in, K. S.; Currie, M.; Lindgren, M.; Milostnaya, I. I.; Verevkin, A. A.; Gol'tsman, G. N.; Sobolewski, R. |
Quantum efficiency and time-domain response of superconducting NbN hot-electron photodetectors |
1999 |
IEEE Trans. Appl. Supercond. |
9 |
3338-3341 |
|
|
|
Lindgren, M.; Currie, M.; Zeng, W.-S.; Sobolewski, R.; Cherednichenko, S.; Voronov, B.; Gol'tsman, G. N. |
Picosecond response of a superconducting hot-electron NbN photodetector |
1998 |
Appl. Supercond. |
6 |
423-428 |
|
|
|
Korneev, A.; Lipatov, A.; Okunev, O.; Chulkova, G.; Smirnov, K.; Gol’tsman, G.; Zhang, J.; Slysz, W.; Verevkin, A.; Sobolewski, R. |
GHz counting rate NbN single-photon detector for IR diagnostics of VLSI CMOS circuits |
2003 |
Microelectronic Engineering |
69 |
274-278 |
|
|
|
Zhang, J.; Boiadjieva, N.; Chulkova, G.; Deslandes, H.; Gol'tsman, G. N.; Korneev, A.; Kouminov, P.; Leibowitz, M.; Lo, W.; Malinsky, R.; Okunev, O.; Pearlman, A.; Slysz, W.; Smirnov, K.; Tsao, C.; Verevkin, A.; Voronov, B.; Wilsher, K.; Sobolewski, R. |
Noninvasive CMOS circuit testing with NbN superconducting single-photon detectors |
2003 |
Electron. Lett. |
39 |
1086-1088 |
|
