| 
Citations
 | 
   web
Galeazzi, M. (2011). Fundamental noise processes in TES devices. IEEE Trans. Appl. Supercond., 21(3), 267–271.
toggle visibility
Bennett, D. A., Schmidt, D. R., Swetz, D. S., & Ullom, J. N. (2014). Phase-slip lines as a resistance mechanism in transition-edge sensors. Appl. Phys. Lett., 104, 042602.
toggle visibility