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Phillips, T. G., & Jefferts, K. B. (1973). A low temperature bolometer heterodyne receiver for Millimeter wave astronomy. Rev. Sci. Instrum., 44(8), 1009–1014.
Abstract: Liquid helium cooled InSb hot electronbolometers are used in a balanced mixer configuration as detectors for an imagelessmicrowave receiver. The system is designed for mounting at the prime focus of the National Radio Astronomy Observatory (NRAO) 11 m antenna at Kitt Peak, Arizona, and is suitable for the study of rotational line spectra of interstellar gas molecules. Currently the operating frequency is in the 90–140 GHz band where the double sideband system noise temperature is 250 K.
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Sahu, M., Bae, M. - H., Rogachev, A., Pekker, D., Wei, T. - C., Shah, N., et al. (2009). Individual topological tunnelling events of a quantum field probed through their macroscopic consequences. Nature Phys., 5, 503–508.
Abstract: Phase slips are topological fluctuations that carry the superconducting order-parameter field between distinct current-carrying states. Owing to these phase slips, superconducting nanowires acquire electrical resistance. In such wires, it is well known that at higher temperatures phase slips occur through the process of thermal barrier-crossing by the order-parameter field. At low temperatures, the general expectation is that phase slips should proceed through quantum tunnelling events, which are known as quantum phase slips. However, resistive measurements have produced evidence both for and against the occurrence of quantum phase slips. Here, we report evidence for the observation of individual quantum phase-slip events in homogeneous ultranarrow wires at high bias currents. We accomplish this through measurements of the distribution of switching currents for which the width exhibits a rather counter-intuitive, monotonic increase with decreasing temperature. Importantly, measurements show that in nanowires with larger critical currents, quantum fluctuations dominate thermal fluctuations up to higher temperatures.
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Bennett, D. A., Schmidt, D. R., Swetz, D. S., & Ullom, J. N. (2014). Phase-slip lines as a resistance mechanism in transition-edge sensors. Appl. Phys. Lett., 104, 042602.
Abstract: The fundamental mechanism of resistance in voltage-biased superconducting films is poorly understood despite its importance as the basis of transition-edge sensors (TESs). TESs are utilized in state-of-the-art microbolometers and microcalorimeters covering a wide range of energies and applications. We present a model for the resistance of a TES based on phase-slip lines (PSLs) and compare the model to data. One of the model's predictions, discrete changes in the number of PSLs, is a possible explanation for the observed switching between discrete current states in localized regions of bias.
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Swetz, D. S., Bennett, D. A., Irwin, K. D., Schmidt, D. R., & Ullom, J. N. (2012). Current distribution and transition width in superconducting transition-edge sensors. Appl. Phys. Lett., 101, 242603.
Abstract: Present models of the superconducting-to-normal transition in transition-edge sensors (TESs) do not describe the current distribution within a biased TES. This distribution is complicated by normal-metal features that are integral to TES design. We present a model with one free parameter that describes the evolution of the current distribution with bias. To probe the current distribution experimentally, we fabricated TES devices with different current return geometries. Devices where the current return geometry mirrors current flow within the device have sharper transitions, thus allowing for a direct test of the current-flow model.Measurements from these devices show that current meanders through a TES low in the resistivetransition but flows across the normal-metal features by 40% of the normal-state resistance. Comparison of transition sharpness between device designs reveals that self-induced magnetic fields play an important role in determining the width of the superconducting transition.
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Carlstrom, J. E., & Jonas Zmuidzinas. (1996). Millimeter and Submillimeter Techniques. (848). Review of radio science 1993–1996, (34). New York: Oxford University Press Inc.
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