| |
Author |
Title |
Year |
Publication  |
Volume |
Pages |
Links |
|
|
Chulcova, G. M.; Ptitsina, N. G.; Gershenzon, E. M.; Gershenzon, M. E.; Sergeev, A. V. |
Effect of the interference between electron-phonon and electron-impurity (boundary) scattering on resistivity Nb, Al, Be films |
1996 |
Czech J. Phys. |
46 |
2489-2490 |
|
|
|
Il'in, K. S.; Karasik, B. S.; Ptitsina, N. G.; Sergeev, A. V.; Gol'tsman, G. N.; Gershenzon, E. M.; Pechen, E. V.; Krasnosvobodtsev, S. I. |
Electron-phonon-impurity interference in thin NbC films: electron inelastic scattering time and corrections to resistivity |
1996 |
Czech. J. Phys. |
46 |
857-858 |
|
|
|
Eletskii, A. V.; Sarychev, A. K.; Boginskaya, I. A.; Bocharov, G. S.; Gaiduchenko, I. A.; Egin, M. S.; Ivanov, A. V.; Kurochkin, I. N.; Ryzhikov, I. A.; Fedorov, G. E. |
Amplification of a Raman scattering signal by carbon nanotubes |
2018 |
Dokl. Phys. |
63 |
496-498 |
|
|
|
Fedder, H.; Oesterwind, S.; Wick, M.; Olbrich, F.; Michler, P.; Veigel, T.; Berroth, M.; Schlagmüller, M. |
Characterization of electro-optical devices with low jitter single photon detectors – towards an optical sampling oscilloscope beyond 100 GHz |
2018 |
ECOC |
|
1-3 |
|
|
|
Zhang, J.; Boiadjieva, N.; Chulkova, G.; Deslandes, H.; Gol'tsman, G. N.; Korneev, A.; Kouminov, P.; Leibowitz, M.; Lo, W.; Malinsky, R.; Okunev, O.; Pearlman, A.; Slysz, W.; Smirnov, K.; Tsao, C.; Verevkin, A.; Voronov, B.; Wilsher, K.; Sobolewski, R. |
Noninvasive CMOS circuit testing with NbN superconducting single-photon detectors |
2003 |
Electron. Lett. |
39 |
1086-1088 |
|
