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  Author Title Year Publication DOI Links
Bennett, Douglas A.; Schmidt, Daniel R.; Swetz, Daniel S.; Ullom, Joel N. Phase-slip lines as a resistance mechanism in transition-edge sensors 2014 Appl. Phys. Lett. 10.1063/1.4863664 details   doi
Titova, N; Kardakova, A.; Tovpeko, N; Ryabchun, S.; Mandal, S.; Morozov, D.; Klemencic, G. M.; Giblin, S.R.; Williams, O. A.; Goltsman, G. N. Superconducting diamond films as perspective material for direct THz detectors 2017 Proc. 28th Int. Symp. Space Terahertz Technol. details   openurl
Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis 2000 Microelectronics Reliability 10.1016/S0026-2714(00)00137-2 details   doi
Stellari, Franco; Song, Peilin Testing of ultra low voltage CMOS microprocessors using the superconducting single-photon detector (SSPD) 2005 Proc. 12th IPFA 10.1109/IPFA.2005.1469119 details   doi
Steudle, Gesine A.; Schietinger, Stefan; Höckel, David; Dorenbos, Sander N.; Zadeh, Iman E.; Zwiller, Valery; Benson, Oliver Measuring the quantum nature of light with a single source and a single detector 2012 Phys. Rev. A 10.1103/PhysRevA.86.053814 details   doi
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