Baeva, E., Sidorova, M., Korneev, A., & Goltsman, G. (2018). Precise measurement of the thermal conductivity of superconductor. In Proc. AIP Conf. (Vol. 1936, 020003 (1 to 4)).
Abstract: Measuring the thermal properties such as the heat capacity provide information about intrinsic mechanisms operated inside. In general, the ratio between electron and phonon specific heat Ce/Cp shows how the absorbed energy shared between electron and phonon subsystems. In this work we make estimations for amplitude-modulated absorption of THz radiation technique for investigation of the ratio Ce/Cp in superconducting Niobium Nitride (NbN) at T = Tc. Our results indicates that experimentally the frequency of modulation has to be extra large to extract the quantity. We perform a new technique allowed to work at low frequency with accurately measurement of absorbed power.
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Sych, D., Shcherbatenko, M., Elezov, M., & Goltsman, G. N. (2018). Towards the improvement of the heterodyne receiver sensitivity beyond the quantum noise limit. In Proc. 29th Int. Symp. Space Terahertz Technol. (pp. 245–247).
Abstract: Noise reduction in heterodyne receivers of the terahertz range is an important issue for astronomical applications. Quantum fluctuations, also known as shot noise, prohibit errorless measurements of the amplitude of electro-magnetic waves, and introduce the so-called standard quantum limit (SQL) on the minimum error of the heterodyne measurements. Nowadays, the sensitivity of modern heterodyne receivers approaches the SQL, and the growing demand for the improvement of measurement precision stimulates a number of both theoretical and experimental efforts to design novel measurement techniques aimed at overcoming the SQL. Here we demonstrate the first steps towards the practical implementation of a sub-SQL quantum receiver. As the principal resources, it requires a highly efficient single-photon counting detector and an interferometer-based scheme for mixing the signal with a low-power local oscillator. We describe the idea of such receiver and its main components.
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Gayduchenko, I. A., Moskotin, M. V., Matyushkin, Y. E., Rybin, M. G., Obraztsova, E. D., Ryzhii, V. I., et al. (2018). The detection of sub-terahertz radiation using graphene-layer and graphene-nanoribbon FETs with asymmetric contacts. In Materials Today: Proc. (Vol. 5, pp. 27301–27306).
Abstract: We report on the detection of sub-terahertz radiation using single layer graphene and graphene-nanoribbon FETs with asymmetric contacts (one is the Schottky contact and one – the Ohmic contact). We found that cutting graphene into ribbons a hundred nanometers wide leads to a decrease of the response to sub-THz radiation. We show that suppression of the response in the graphene nanoribbons devices can be explained by unusual properties of the Schottky barrier on graphene-vanadium interface.
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Belosevich, V. V., Gayduchenko, I. A., Titova, N. A., Zhukova, E. S., Goltsman, G. N., Fedorov, G. E., et al. (2018). Response of carbon nanotube film transistor to the THz radiation. In EPJ Web Conf. (Vol. 195, 05012 (1 to 2)).
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Tretyakov, I., Kaurova, N., Raybchun, S., Goltsman, G. N., & Silaev, A. A. (2018). Technology for NbN HEB based multipixel matrix of THz range. In EPJ Web Conf. (Vol. 195, 05011).
Abstract: The influence of homogeneity disorder degree of the thin superconducting NbN film across of Si wafer on characteristics of the Hot Electron Bolometers (HEB) has been investigated. Our experiments have been carried out near the superconducting transition and far below it. The high homogeneity disorder degree of the NbN film has been achieved by preparing the Si substrate surface. The fabricated HEBs all have almost identical R (T) characteristics with a dispersion of Tc and the normal resistance R300 of not more than 0.15K and 2 Ω, respectively. The quality of the devises allows us to demonstrate clearly the influence of non-equilibrium processes in the S’SS’ system on the device performance. Our fabrication technology also allows creating multiplex heterodyne and direct detector matrices based the HEB devices.
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