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Author Gao, J. R.; Hajenius, M.; Baselmans, J. J. A.; Klapwijk, T. M.; de Korte, P. A. J.; Voronov, B.; Gol'tsman, G. url  openurl
  Title NbN hot electron bolometer mixers with superior performance for space applications Type Conference Article
  Year 2004 Publication Proc. Int. workshop on low temp. electronics Abbreviated Journal Proc. Int. workshop on low temp. electronics  
  Volume Issue Pages 11-17  
  Keywords NbN HEB mixers, applications  
  Abstract  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Noordwijk Editor Armandillo, E.; Leone, B.  
  Language Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN ISBN Medium  
  Area Expedition Conference International workshop on low temperature electronics- WOLTE 6 - Noordwijk  
  Notes Approved no  
  Call Number Serial 1496  
Permanent link to this record
 

 
Author Gershenson, E. M.; Gol'tsman, G. N.; Elant'ev, A. I.; Kagane, M. L.; Multanovskii, V. V.; Ptitsina, N. G. url  openurl
  Title Use of submillimeter backward-wave tube spectroscopy in determination of the chemical nature and concentration of residual impurities in pure semiconductors Type Journal Article
  Year 1983 Publication Sov. Phys. Semicond. Abbreviated Journal Sov. Phys. Semicond.  
  Volume 17 Issue 8 Pages 908-913  
  Keywords BWO spectroscopy, pure semiconductors, residual impurities  
  Abstract  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Editor  
  Language Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
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  Area Expedition Conference  
  Notes Применение субмиллиметровой ЛОВ спектроскопии для определения химической природы и концентрации примесей в чистых полупроводниках Approved no  
  Call Number Serial 1714  
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Author Gershenzon, E. M.; Gol'tsman, G. N. url  openurl
  Title Effect of electromagnetic radiation on a superconductor in a magnetic field Type Conference Article
  Year 1988 Publication Izv. Akad. Nauk SSSR, Seriya Fizicheskaya Abbreviated Journal Izv. Akad. Nauk SSSR, Seriya Fizicheskaya  
  Volume 52 Issue 3 Pages 449-451  
  Keywords  
  Abstract The effect of electromagnetic radiation on thin superconducting films of Nb with a large number of static defects is investigated experimentally for the case where the film is in the resistive state due to an applied magnetic field and transport current. The results obtained are found to be well described by a model of spatially homogeneous electron heating. It is noted that the results obtained here for Nb films are also valid for Al, NbN, and MoRe films.  
  Address  
  Corporate Author Thesis  
  Publisher Place of Publication Editor  
  Language Russian Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0367-6765 ISBN Medium  
  Area Expedition Conference 4th Vsesoiuznyi Seminar po Opticheskomu Detektirovaniiu Magnitnykh Rezonansov v Tverdykh Telakh, Tallin, Estonian SSR, Apr. 1987  
  Notes Approved no  
  Call Number Serial 1702  
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Author Karasik, B. S.; Il'in, K. S.; Ptitsina, N. G.; Gol'tsman, G. N.; Gershenzon, E. M.; Pechen', E. V.; Krasnosvobodtsev, S. I. url  openurl
  Title Electron-phonon scattering rate in impure NbC films Type Abstract
  Year 1998 Publication NASA/ADS Abbreviated Journal NASA/ADS  
  Volume Issue Pages Y35.08  
  Keywords NbC films  
  Abstract The study of the electron-phonon interaction in thin (20 nm) NbC films with electron mean free path l=2-13 nm gives an evidence that electron scattering is significantly modified due to the interference between electron-phonon and elastic electron scattering from impurities. The interference ~T^2-term, which is proportional to the residual resistivity, dominates over the Bloch-Grüneisen contribution to resistivity at low temperatures up to 60 K. The electron energy relaxation rate is directly measured via the relaxation of hot electrons heated by modulated electromagnetic radiation. In the temperature range 1.5 – 10 K the relaxation rate shows a weak dependence on the electron mean free path and strong temperature dependence T^n with the exponent n = 2.5-3. This behaviour is well explained by the theory of the electron-phonon-impurity interference taking into account the electron coupling with transverse phonons determined from the resistivity data.  
  Address  
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  Area Expedition Conference American Physical Society, Annual March Meeting, March 16-20, 1998 Los Angeles, CA  
  Notes Approved no  
  Call Number Serial 1591  
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Author Hübers, Heinz-Wilhelm; Semenov, A.; Richter, H.; Smirnov, K.; Gol'tsman, G.; Voronov, B. url  openurl
  Title Phonon cooled far-infrared hot electron bolometer mixer Type Abstract
  Year 2002 Publication NASA/ADS Abbreviated Journal NASA/ADS  
  Volume Issue Pages  
  Keywords NbN HEB mixers  
  Abstract Heterodyne receivers for applications in astronomy need quantum-limited sensitivity. At frequencies above 1.4 THz superconducting hot electron bolometers (HEB) can be used to achieve this goal. We present results of the development of a quasi-optical phonon-cooled NbN HEB mixer for GREAT, the German heterodyne receiver for SOFIA. Different mixers with logarithmic spiral and double slot feed antennas have been investigated with respect to their noise temperature, conversion loss, linearity and beam pattern at several frequencies between 0.7 THz and 5.2 THz. At 2.5 THz a double sideband noise temperature of 2200 K was achieved. The conversion loss was 16 dB. The response of the mixer was linear up to 400 K load temperature. This performance was verified by measuring an emission line of methanol at 2.5 THz. The results demonstrate that the NbN HEB is very well suited as a mixer for FIR heterodyne receivers.  
  Address Monterey, CA  
  Corporate Author Thesis  
  Publisher Place of Publication Editor  
  Language Summary Language Original Title  
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  ISSN ISBN Medium  
  Area Expedition Conference Far-IR, Sub-mm & MM Detector Technology Workshop, 1-3 April 2002  
  Notes id.37 Approved no  
  Call Number Serial 1534  
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