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Slysz, W.; Wegrzecki, M.; Bar, J.; Grabiec, P.; Gol'tsman, G. N.; Verevkin, M.; Sobolewski, R. NbN superconducting single-photon detectors coupled with a communication fiber 2004 INIS 37 1-2 details   url
Zhang, J.; Boiadjieva, N.; Chulkova, G.; Deslandes, H.; Gol'tsman, G. N.; Korneev, A.; Kouminov, P.; Leibowitz, M.; Lo, W.; Malinsky, R.; Okunev, O.; Pearlman, A.; Slysz, W.; Smirnov, K.; Tsao, C.; Verevkin, A.; Voronov, B.; Wilsher, K.; Sobolewski, R. Noninvasive CMOS circuit testing with NbN superconducting single-photon detectors 2003 Electron. Lett. 39 1086-1088 details   doi
Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis 2000 Microelectronics Reliability 40 1353-1358 details   doi
Milostnaya, I.; Korneev, A.; Rubtsova, I.; Seleznev, V.; Minaeva, O.; Chulkova, G.; Okunev, O.; Voronov, B.; Smirnov, K.; Gol'tsman, G.; Slysz, W.; Wegrzecki, M.; Guziewicz, M.; Bar, J.; Gorska, M.; Pearlman, A.; Kitaygorsky, J.; Cross, A.; Sobolewski, R. Superconducting single-photon detectors designed for operation at 1.55-µm telecommunication wavelength 2006 J. Phys.: Conf. Ser. 43 1334-1337 details   doi
Florya, I. N.; Korneeva, Y. P.; Mikhailov, M. Y.; Devizenko, A. Y.; Korneev, A. A.; Goltsman, G. N. Photon counting statistics of superconducting single-photon detectors made of a three-layer WSi film 2018 Low Temp. Phys. 44 221-225 details   doi
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