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Gorokhov G, Bychanok D, Gayduchenko I, Rogov Y, Zhukova E, Zhukov S, et al. THz spectroscopy as a versatile tool for filler distribution diagnostics in polymer nanocomposites. Polymers (Basel). 2020;12(12):3037 (1 to 14).
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Gershenzon EM, Goltsman GN, Orlov L. Investigation of population and ionization of donor excited states in Ge. In: Physics of Semiconductors. North-Holland Publishing Co.; 1976. p. 631–4.
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Prober DE. Superconducting terahertz mixer using a transition-edge microbolometer. Appl Phys Lett. 1993;62(17):2119–21.
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Miller AJ, Lita AE, Calkins B, Vayshenker I, Gruber SM, Nam SW. Compact cryogenic self-aligning fiber-to-detector coupling with losses below one percent. Opt Express. 2011;19(10):9102–10.
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Hoevers HFC, Bento AC, Bruijn MP, Gottardi L, Korevaar MAN, Mels WA, et al. Thermal fluctuation noise in a voltage biased superconducting transition edge thermometer. Appl Phys Lett. 2000;77(26):4421–4.
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Kooi JW. Advanced receivers for submillimeter and far infrared astronomy [Doctoral thesis].; 2008.
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Galeazzi M. Fundamental noise processes in TES devices. IEEE Trans Appl Supercond. 2011;21(3):267–71.
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Bennett DA, Schmidt DR, Swetz DS, Ullom JN. Phase-slip lines as a resistance mechanism in transition-edge sensors. Appl Phys Lett. 2014;104:042602.
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Titova N, Kardakova A, Tovpeko N, Ryabchun S, Mandal S, Morozov D, et al. Superconducting diamond films as perspective material for direct THz detectors [abstract]. In: Proc. 28th Int. Symp. Space Terahertz Technol.; 2017. 82.
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Manus MKM, Kash JA, Steen SE, Polonsky S, Tsang JC, Knebel DR, et al. PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis. Microelectronics Reliability. 2000;40:1353–8.
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