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Author
Гершензон, Е. М.
;
Гольцман, Г. Н.
;
Елантьев, А. И.
;
Кагане, М. Л.
;
Мултановский, В. В.
;
Птицина, Н. Г.
Title
Применение субмиллиметровой ЛОВ спектроскопии для определения химической природы и концентрации примесей в чистых полупроводниках
Type
Journal Article
Year
1983
Publication
Физика и техника полупроводников
Abbreviated Journal
Физика и техника полупроводников
Volume
17
Issue
8
Pages
1430-1437
Keywords
BWO spectroscopy, pure semiconductors, residual impurities
Abstract
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Russian
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Notes
Duplicated as 1714
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no
Call Number
Serial
1712
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