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Chulcova GM, Ptitsina NG, Gershenzon EM, Gershenzon ME, Sergeev AV. Effect of the interference between electron-phonon and electron-impurity (boundary) scattering on resistivity Nb, Al, Be films. In: Czech J. Phys. Vol 46.; 1996. p. 2489–90.
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Maslennikov SN, Morozov DV, Ozhegov RV, Smirnov KV, Okunev OV, Gol’tsman GN. Imaging system for submillimeter wave range based on AlGaAs/GaAs hot electron bolometer mixers. In: Proc. 5-th MSMW. Vol 2.; 2004. p. 558–60.
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Shangina EL, Smirnov KV, Morozov DV, Kovalyuk VV, Goltsman GN, Verevkin AA, et al. Concentration dependence of energy relaxation time in AlGaAs/GaAs heterojunctions: direct measurements. Semicond Sci Technol. 2011;26(2):025013.
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Schwaab GW, Hübers H-W, Schubert J, Erichsen P, Gol'tsman G, Semenov A, et al. A high resolution spectrometer for the investigation of molecular structures in the THZ range. In: Proc. 10th Int. Symp. Space Terahertz Technol.; 1999. p. 530–8.
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Kardakova A, Shishkin A, Semenov A, Goltsman GN, Ryabchun S, Klapwijk TM, et al. Relaxation of the resistive superconducting state in boron-doped diamond films. Phys Rev B. 2016;93(6):064506.
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Zubkova E, An P, Kovalyuk V, Korneev A, Ferrari S, Pernice W, et al. Optimization of contra-directional coupler based on silicon nitride Bragg rib waveguide. In: J. Phys.: Conf. Ser. Vol 1124.; 2018. 051048.
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Zubkova E, An P, Kovalyuk V, Korneev A, Goltsman G. Integrated Bragg waveguides as an efficient optical notch filter on silicon nitride platform. In: Proc. SPBOPEN.; 2017. p. 449–50.
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Komrakova S, Javadzade J, Vorobyov V, Bolshedvorskii S, Soshenko V, Akimov A, et al. CMOS compatible nanoantenna-nanodiamond integration. In: J. Phys.: Conf. Ser. Vol 1410.; 2019. 012180.
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Гершензон ЕМ, Гольцман ГН, Елантьев АИ, Кагане МЛ, Мултановский ВВ, Птицина НГ. Применение субмиллиметровой ЛОВ спектроскопии для определения химической природы и концентрации примесей в чистых полупроводниках. Физика и техника полупроводников. 1983;17(8):1430–7.
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Gershenson EM, Gol'tsman GN, Elant'ev AI, Kagane ML, Multanovskii VV, Ptitsina NG. Use of submillimeter backward-wave tube spectroscopy in determination of the chemical nature and concentration of residual impurities in pure semiconductors. Sov Phys Semicond. 1983;17(8):908–13.
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