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Smirnov KV, Vachtomin YB, Antipov SV, Maslennikov SN, Kaurova NS, Drakinsky VN, et al. Noise and gain performance of spiral antenna coupled HEB mixers at 0.7 THz and 2.5 THz. In: Proc. 14th Int. Symp. Space Terahertz Technol.; 2003. p. 405–12.
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Il'in K, Siegel M, Semenov A, Engel A, Hübers H-W, Hollmann E, et al. Thickness dependence of superconducting properties of ultrathin Nb and NbN films. In: AKF-Frühjahrstagung.; 2004.
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Semenov A, Richter H, Hübers H-W, Smirnov K, Voronov B, Gol'tsman G. Development of terahertz superconducting hot-electron bolometer mixers. In: Proc. 6th European Conf. Appl. Supercond. Vol 181.; 2003. p. 2960–5.
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Richter H, Semenov A, Hubers H-W, Smirnov K, Gol’tsman G, Voronov B. Phonon cooled hot-electron bolometric mixer for 1-5 THz. In: Proc. 29th IRMMW / 12th THz.; 2004. p. 241–2.
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Rubtsova I, Korneev A, Matvienko V, Chulkova G, Milostnaya I, Goltsman G, et al. Spectral sensitivity, quantum efficiency, and noise equivalent power of NbN superconducting single-photon detectors in the IR range. In: Proc. 29th IRMMW / 12th THz.; 2004. p. 461–2.
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Hoogeveen RWM, Yagoubov PA, Maurellis A, Koshelets VP, Shitov SV, Mair U, et al. New cryogenic heterodyne techniques applied in TELIS: the balloonborne THz and submillimeter limb sounder for atmospheric research. In: Strojnik M, editor. Proc. SPIE. Vol 5152. SPIE; 2003. p. 347–55.
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Meledin D, Tong C-YE, Blundell R, Goltsman G. Measurement of intermediate frequency bandwidth of hot electron bolometer mixers at terahertz frequency range. IEEE Microw Wireless Compon Lett. 2003;13(11):493–5.
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Zhang J, Pearlman A, Slysz W, Verevkin A, Sobolewski R, Wilsher K, et al. A superconducting single-photon detector for CMOS IC probing. In: Proc. 16-th LEOS. Vol 2.; 2003. p. 602–3.
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Korneev A, Lipatov A, Okunev O, Chulkova G, Smirnov K, Gol’tsman G, et al. GHz counting rate NbN single-photon detector for IR diagnostics of VLSI CMOS circuits. Microelectronic Engineering. 2003;69(2-4):274–8.
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Zhang J, Boiadjieva N, Chulkova G, Deslandes H, Gol'tsman GN, Korneev A, et al. Noninvasive CMOS circuit testing with NbN superconducting single-photon detectors. Electron Lett. 2003;39(14):1086–8.
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