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Ozhegov RV, Gorshkov KN, Okunev OV, Gol’tsman GN. Superconducting hot-electron bolometer mixer as element of thermal imager matrix. Tech Phys Lett. 2010;36(11):1006–8.
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Milostnaya I, Korneev A, Tarkhov M, Divochiy A, Minaeva O, Seleznev V, et al. Superconducting single photon nanowire detectors development for IR and THz applications. J Low Temp Phys. 2008;151(1-2):591–6.
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Zhang J, Slysz W, Verevkin A, Okunev O, Chulkova G, Korneev A, et al. Response time characterization of NbN superconducting single-photon detectors. IEEE Trans. Appl. Supercond.. 2003;13(2):180–3.
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Jukna A, Kitaygorsky J, Pan D, Cross A, Perlman A, Komissarov I, et al. Dynamics of hotspot formation in nanostructured superconducting stripes excited with single photons. Acta Physica Polonica A. 2008;113(3):955–8.
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Słysz W, Węgrzecki M, Bar J, Grabiec P, Górska M, Zwiller V, et al. Fiber-coupled single-photon detectors based on NbN superconducting nanostructures for practical quantum cryptography and photon-correlation studies. Appl Phys Lett. 2006;88(26):261113 (1 to 3).
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Verevkin A, Pearlman A, Slysz W, Zhang J, Currie M, Korneev A, et al. Ultrafast superconducting single-photon detectors for near-infrared-wavelength quantum communications. J Modern Opt. 2004;51(9-10):1447–58.
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Korneev A, Lipatov A, Okunev O, Chulkova G, Smirnov K, Gol’tsman G, et al. GHz counting rate NbN single-photon detector for IR diagnostics of VLSI CMOS circuits. Microelectronic Engineering. 2003;69(2-4):274–8.
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Zhang J, Boiadjieva N, Chulkova G, Deslandes H, Gol'tsman GN, Korneev A, et al. Noninvasive CMOS circuit testing with NbN superconducting single-photon detectors. Electron Lett. 2003;39(14):1086–8.
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Zhang J, Słysz W, Pearlman A, Verevkin A, Sobolewski R, Okunev O, et al. Time delay of resistive-state formation in superconducting stripes excited by single optical photons. Phys Rev B. 2003;67(13):132508 (1 to 4).
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Lipatov A, Okunev O, Smirnov K, Chulkova G, Korneev A, Kouminov P, et al. An ultrafast NbN hot-electron single-photon detector for electronic applications. Supercond Sci Technol. 2002;15(12):1689–92.
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