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Torgashin MY, Koshelets VP, Dmitriev PN, Ermakov AB, Filippenko LV, Yagoubov PA. Superconducting integrated receivers based on Nb-AlN-NbN circuits. IEEE Trans. Appl. Supercond.. 2007;17(2):379–82.
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Hans Ekstrom, Karasik BS, Kollberg EL, Sigfrid Yngvesson. Conversion gain and noise of niobium superconducting hot–electron–mixers. IEEE Trans. Appl. Supercond.. 1995;43(4):938–47.
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Karpov A, Blondel J, Voss M, Gundlach KH. A three photon noise SIS heterodyne receiver at submillimeter wavelength. IEEE Trans. Appl. Supercond.. 1999;9(2):4456–9.
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Shitov SV, Levitchev M, Veretennikov AV, Koshelets VP, Prokopenko GV, Filippenko LV, et al. Superconducting integrated receiver as 400-600 GHz tester for coolable devices. IEEE Trans. Appl. Supercond.. 2001;11(1):832–5.
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Yang JKW, Kerman AJ, Dauler EA, Anant V, Rosfjord KM, Berggren KK. Modeling the electrical and thermal response of superconducting nanowire single-photon detectors. IEEE Trans. Appl. Supercond.. 2007;17(2):581–5.
Abstract: We modeled the response of superconducting nanowire single-photon detectors during a photodetection event, taking into consideration only the thermal and electrical properties of a superconducting NbN nanowire on a sapphire substrate. Our calculations suggest that heating which occurs after the formation of a photo-induced resistive barrier is responsible for the generation of a measurable voltage pulse. We compared this numerical result with experimental data of a voltage pulse from a slow device, i.e. large kinetic inductance, and obtained a good fit. Using this electro-thermal model, we estimated the temperature rise and the resistance buildup in the nanowire, and the return current at which the nanowire becomes superconducting again. We also show that the reset time of these photodetectors can be decreased by the addition of a series resistance and provide supporting experimental data. Finally we present preliminary results on a detector latching behavior that can also be explained using the electro-thermal model.
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Xiaolong Hu, Holzwarth CW, Masciarelli D, Dauler EA, Berggren KK. Efficiently coupling light to superconducting nanowire single-photon detectors. IEEE Trans. Appl. Supercond.. 2009;19(3):336–40.
Abstract: We designed superconducting nanowire single-photon detectors (SNSPDs) integrated with silver optical antennae for free-space coupling and a dielectric waveguide for fiber coupling. According to our finite-element simulation, (1) for the free-space coupling, the absorptance of the NbN nanowire for TM-polarized photons at the wavelength of 1550 nm can be as high as 96% by adding silver optical antennae; (2) for the fiber coupling, the absorptance of the NbN nanowire for TE-like-polarized photons can reach 76% including coupling efficiency at the wavelength of 1550 nm by adding a silicon nitride waveguide and an inverse-taper coupler.
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Yamashita T, Miki S, Qiu W, Fujiwara M, Sasaki M, Wang Z. Temperature dependent performances of superconducting nanowire single-photon detectors in an ultralow-temperature region. IEEE Trans. Appl. Supercond.. 2010;21(3):336–9.
Abstract: We report on the performance of a fiber-coupled superconducting nanowire single-photon detector (SNSPD) from 4 K down to the ultralow temperature of 16 mK for a 1550 nm wave length. The system detection efficiency (DE) increased with de creasing the temperature and reached the considerably high value of 15% with a dark count rate less than 100 cps below 1.5 K, even without an optical cavity structure. We also observed saturation of the system DE in its bias current dependency at 16 mK, which indicates that the device DE of our SNSPD nearly reached intrinsic DE despite the device having a large active area of 20 μm × 20 μm. The dark count was finite even at 16 mK and the black body radiation becomes its dominant origin in the low temperatures for fiber-coupled devices.
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Yang JKW, Kerman AJ, Dauler EA, Cord B, Anant V, Molnar RJ, et al. Suppressed critical current in superconducting nanowire single-photon detectors with high fill-factors. IEEE Trans. Appl. Supercond.. 2009;19(3):318–22.
Abstract: In this work we present a new fabrication process that enabled the fabrication of superconducting nanowire single photon detectors SNSPD with fill-factors as high as 88% with gaps between nanowires as small as 12 nm. This fabrication process combined high-resolution electron-beam lithography with photolithography. Although this work was motivated by the potential of increased detection efficiency with higher fill-factor devices, test results showed an unexpected systematic suppression in device critical currents with increasing fill-factor.
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Kawakami A, Saito S, Hyodo M. Fabrication of nano-antennas for superconducting Infrared detectors. IEEE Trans. Appl. Supercond.. 2011;21(3):632–5.
Abstract: To improve the response performance of superconducting infrared detectors, we have developed a fabrication process for nano-antennas. A nano-antenna consists of a dipole antenna, and a superconducting thin film strip placed in the antenna's center. By measuring the transition temperature of the superconducting strips, we confirmed that their superconductivity maintained a good condition after the nano-antenna fabrication process. We also evaluated nano-antenna characteristics using Fourier transform infrared spectroscopy. The evaluated antenna length and width were respectively set at around 2400 nm and 400 nm, and the antennas were placed at intervals of several micrometers around the area of 1 mm2 . In an evaluation of spectral transmission characteristics, clear absorption caused by antenna effects was observed at around 1400 cm-1. High polarization dependencies were also observed.
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Galeazzi M. Fundamental noise processes in TES devices. IEEE Trans Appl Supercond. 2011;21(3):267–71.
Abstract: Microcalorimeters and bolometers are noise-limited devices, therefore, a proper understanding of all noise sources is essential to predict and interpret their performance. In this paper, I review the fundamental noise processes contributing to Transition Edge Sensor (TES) microcalorimeters and bolometers and their effect on device performance. In particular, I will start with a simple, monolithic device model, moving to a more complex one involving discrete components, to finally move to today's more realistic, comprehensive model. In addition to the basic noise contribution (equilibrium Johnson noise and phonon noise), TES are significantly affected by extra noise, which is commonly referred to as excess noise. Different fundamental processes have been proposed and investigated to explain the origin of this excess noise, in particular near equilibrium non-linear Johnson noise, flux-flow noise, and internal thermal fluctuation noise. Experimental evidence shows that all three processes are real and contribute, at different levels, to the TES noise, although different processes become important at different regimes. It is therefore time to discard the term “excess noise” and consider these terms part of the “fundamental noise processes” instead.
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