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Author | Гершензон, Е. М.; Гольцман, Г. Н.; Елантьев, А. И.; Кагане, М. Л.; Мултановский, В. В.; Птицина, Н. Г. | ||||
Title | Применение субмиллиметровой ЛОВ спектроскопии для определения химической природы и концентрации примесей в чистых полупроводниках | Type | Journal Article | ||
Year | 1983 | Publication | Физика и техника полупроводников | Abbreviated Journal | Физика и техника полупроводников |
Volume | 17 | Issue | 8 | Pages | 1430-1437 |
Keywords | BWO spectroscopy, pure semiconductors, residual impurities | ||||
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Publisher | Place of Publication | Editor | |||
Language | Russian | Summary Language | Original Title | ||
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Area | Expedition | Conference | |||
Notes | Duplicated as 1714 | Approved | no | ||
Call Number | Serial | 1712 | |||
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