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Bennett DA, Schmidt DR, Swetz DS, Ullom JN. Phase-slip lines as a resistance mechanism in transition-edge sensors. Appl Phys Lett. 2014;104:042602.
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Titova N, Kardakova A, Tovpeko N, Ryabchun S, Mandal S, Morozov D, et al. Superconducting diamond films as perspective material for direct THz detectors [abstract]. In: Proc. 28th Int. Symp. Space Terahertz Technol.; 2017. 82.
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Manus MKM, Kash JA, Steen SE, Polonsky S, Tsang JC, Knebel DR, et al. PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis. Microelectronics Reliability. 2000;40:1353–8.
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Stellari F, Song P. Testing of ultra low voltage CMOS microprocessors using the superconducting single-photon detector (SSPD). In: Proc. 12th IPFA. IEEE; 2005. 2.
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Steudle GA, Schietinger S, Höckel D, Dorenbos SN, Zadeh IE, Zwiller V, et al. Measuring the quantum nature of light with a single source and a single detector. Phys. Rev. A. 2012;86(5):053814.
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