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Bennett DA, Schmidt DR, Swetz DS, Ullom JN. Phase-slip lines as a resistance mechanism in transition-edge sensors. Appl Phys Lett. 2014;104:042602.
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Manus MKM, Kash JA, Steen SE, Polonsky S, Tsang JC, Knebel DR, et al. PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis. Microelectronics Reliability. 2000;40:1353–8.
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Gershenzon E, Goltsman G, Orlov L, Ptitsina N. Population of excited-states of small admixtures in germanium. In: Izv. Akad. Nauk SSSR, Seriya Fizicheskaya. Vol 42. Mezhdunarodnaya Kniga 39 Dimitrova Ul., 113095 Moscow, Russia; 1978. p. 1154–9.
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Samsonova A, Zolotov P, Baeva E, Lomakin A, Titova N, Kardakova A, et al. Signatures of surface magnetic disorder in thin niobium films. IEEE Trans. Appl. Supercond.. 2021:1.
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Tretyakov I, Shurakov A, Perepelitsa A, Kaurova N, Svyatodukh S, Zilberley T, et al. Silicon room temperature IR detectors coated with Ag2S quantum dots. In: Proc. IWQO.; 2019. p. 369–71.
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