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Slysz W, Wegrzecki M, Bar J, Grabiec P, Gol'tsman GN, Verevkin M, et al. NbN superconducting single-photon detectors coupled with a communication fiber. Vol 37.; 2004.
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Zhang J, Boiadjieva N, Chulkova G, Deslandes H, Gol'tsman GN, Korneev A, et al. Noninvasive CMOS circuit testing with NbN superconducting single-photon detectors. Electron Lett. 2003;39(14):1086–8.
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Manus MKM, Kash JA, Steen SE, Polonsky S, Tsang JC, Knebel DR, et al. PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis. Microelectronics Reliability. 2000;40:1353–8.
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Milostnaya I, Korneev A, Rubtsova I, Seleznev V, Minaeva O, Chulkova G, et al. Superconducting single-photon detectors designed for operation at 1.55-µm telecommunication wavelength. In: J. Phys.: Conf. Ser. Vol 43.; 2006. p. 1334–7.
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Florya IN, Korneeva YP, Mikhailov MY, Devizenko AY, Korneev AA, Goltsman GN. Photon counting statistics of superconducting single-photon detectors made of a three-layer WSi film. Low Temp Phys. 2018;44(3):221–5.
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