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Author Manus, M. K. Mc; Kash, J. A.; Steen, S. E.; Polonsky, S.; Tsang, J.C.; Knebel, D. R.; Huott, W. doi  openurl
  Title PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis Type Journal Article
  Year 2000 Publication Microelectronics Reliability Abbreviated Journal Microelectronics Reliability  
  Volume (down) 40 Issue Pages 1353-1358  
  Keywords SSPD, CMOS testing  
  Abstract Normal operation of complementary metal-oxide semiconductor (CMOS) devices entails the emission of picosecond pulses of light, which can be used to diagnose circuit problems. The pulses that are observed from submicron sized field effect transistors (FETs) are synchronous with logic state switching. Picosecond Imaging Circuit Analysis (PICA), a new optical imaging technique combining imaging with timing, spatially resolves individual devices at the 0.5 micron level and switching events on a 10 picosecond timescale. PICA is used here for the diagnostics of failures on two VLSI microprocessors.  
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  Notes Approved no  
  Call Number Serial 1054  
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Author Zhang, J.; Boiadjieva, N.; Chulkova, G.; Deslandes, H.; Gol'tsman, G. N.; Korneev, A.; Kouminov, P.; Leibowitz, M.; Lo, W.; Malinsky, R.; Okunev, O.; Pearlman, A.; Slysz, W.; Smirnov, K.; Tsao, C.; Verevkin, A.; Voronov, B.; Wilsher, K.; Sobolewski, R. url  doi
openurl 
  Title Noninvasive CMOS circuit testing with NbN superconducting single-photon detectors Type Journal Article
  Year 2003 Publication Electron. Lett. Abbreviated Journal Electron. Lett.  
  Volume (down) 39 Issue 14 Pages 1086-1088  
  Keywords NbN SSPD, SNSPD, applications  
  Abstract The 3.5 nm thick-film, meander-structured NbN superconducting single-photon detectors have been implemented in the CMOS circuit-testing system based on the detection of near-infrared photon emission from switching transistors and have significantly improved the performance of the system. Photon emissions from both p- and n-MOS transistors have been observed.  
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  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0013-5194 ISBN Medium  
  Area Expedition Conference  
  Notes Approved no  
  Call Number Serial 1512  
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Author Манова, Н.Н.; Корнеева, Ю.П.; Корнеев, А.А.; Слыш, В.; Воронов, Б.М.; Гольцман, Г.Н. openurl 
  Title Сверхпроводниковый NbN однофотонный детектор, интегрированный с четвертьволновым резонатором Type Journal Article
  Year 2011 Publication Письма в Журнал технической физики Abbreviated Journal ПЖТФ  
  Volume (down) 37 Issue 10 Pages 7  
  Keywords SSPD  
  Abstract Исследована спектральная зависимость квантовой эффективности сверхпроводниковых NbN однофотонных детекторов, интегрированных с оптическими четвертьволновыми резонаторами с использованием диэлектриков Si3N4, SiO2, SiO.  
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  Notes Approved no  
  Call Number RPLAB @ gujma @ Serial 637  
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Author Manova, N. N.; Korneeva, Yu. P.; Korneev, A. A.; Slysz, W.; Voronov, B. M.; Gol'tsman, G. N. url  doi
openurl 
  Title Superconducting NbN single-photon detector integrated with quarter-wave resonator Type Journal Article
  Year 2011 Publication Tech. Phys. Lett. Abbreviated Journal Tech. Phys. Lett.  
  Volume (down) 37 Issue 5 Pages 469-471  
  Keywords SSPD, SNSPD  
  Abstract The spectral dependence of the quantum efficiency of superconducting NbN single-photon detectors integrated with quarter-wave resonators based on Si3N4, SiO2, and SiO layers has been studied.  
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  Notes Approved no  
  Call Number RPLAB @ gujma @ Serial 664  
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Author Slysz, W.; Wegrzecki, M.; Bar, J.; Grabiec, P.; Gol'tsman, G. N.; Verevkin, M.; Sobolewski, R. url  openurl
  Title NbN superconducting single-photon detectors coupled with a communication fiber Type Miscellaneous
  Year 2004 Publication INIS Abbreviated Journal INIS  
  Volume (down) 37 Issue 2 Pages 1-2  
  Keywords NbN SSPD, SNSPD  
  Abstract  
  Address Stare Jablonki, Poland  
  Corporate Author Thesis  
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  Area Expedition Conference 8-th Electron Technology Conference ELTE  
  Notes Approved no  
  Call Number Serial 1486  
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