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Manus MKM, Kash JA, Steen SE, Polonsky S, Tsang JC, Knebel DR, et al. PICA: Backside failure analysis of CMOS circuits using picosecond imaging circuit analysis. Microelectronics Reliability. 2000;40:1353–8.
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Zhang J, Boiadjieva N, Chulkova G, Deslandes H, Gol'tsman GN, Korneev A, et al. Noninvasive CMOS circuit testing with NbN superconducting single-photon detectors. Electron Lett. 2003;39(14):1086–8.
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Манова НН, Корнеева ЮП, Корнеев АА, Слыш В, Воронов БМ, Гольцман ГН. Сверхпроводниковый NbN однофотонный детектор, интегрированный с четвертьволновым резонатором. ПЖТФ. 2011;37(10):7.
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Manova NN, Korneeva YP, Korneev AA, Slysz W, Voronov BM, Gol'tsman GN. Superconducting NbN single-photon detector integrated with quarter-wave resonator. Tech Phys Lett. 2011;37(5):469–71.
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Slysz W, Wegrzecki M, Bar J, Grabiec P, Gol'tsman GN, Verevkin M, et al. NbN superconducting single-photon detectors coupled with a communication fiber. Vol 37.; 2004.
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