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Author  |
Bennett, Douglas A.; Schmidt, Daniel R.; Swetz, Daniel S.; Ullom, Joel N. | ||||
| Title | Phase-slip lines as a resistance mechanism in transition-edge sensors | Type | Journal Article | ||
| Year | 2014 | Publication | Appl. Phys. Lett. | Abbreviated Journal | Appl. Phys. Lett. |
| Volume | 104 | Issue | Pages | 042602 | |
| Keywords | microbolometers, TES, phase-slip lines, PSL | ||||
| Abstract | The fundamental mechanism of resistance in voltage-biased superconducting films is poorly understood despite its importance as the basis of transition-edge sensors (TESs). TESs are utilized in state-of-the-art microbolometers and microcalorimeters covering a wide range of energies and applications. We present a model for the resistance of a TES based on phase-slip lines (PSLs) and compare the model to data. One of the model's predictions, discrete changes in the number of PSLs, is a possible explanation for the observed switching between discrete current states in localized regions of bias. | ||||
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| Notes | Recommended by Klapwijk | Approved | no | ||
| Call Number | Serial | 929 | |||
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