| Records |
| Author |
Gershenzon, E. M.; Gol'tsman, G. N.; Emtsev, V. V.; Mashovets, T. V.; Ptitsyna, N. G.; Ryvkin, S. M. |
| Title |
Role of impurities of groups III and V in the formation of defects following γ irradiation of germanium |
Type |
Journal Article |
| Year |
1971 |
Publication |
JETP Lett. |
Abbreviated Journal |
JETP Lett. |
| Volume |
14 |
Issue |
6 |
Pages |
241 |
| Keywords |
Ge, gamma irradiation, defects, impurities |
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1742 |
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Гершензон, Е. М.; Семенов, И. Т.; Фогельсон, М. С. |
| Title |
Спин-решеточная релаксация доноров фосфора в кремнии при одноосной деформации образца |
Type |
Journal Article |
| Year |
1985 |
Publication |
Физика и техника полупроводников |
Abbreviated Journal |
Физика и техника полупроводников |
| Volume |
19 |
Issue |
9 |
Pages |
1696-1698 |
| Keywords |
uniaxial pressure, Ge, phosphorus donors, spin-lattice relaxation |
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1760 |
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Банная, В. Ф.; Веселова, Л. И.; Гершензон, Е. М. |
| Title |
Об одном способе определения концентрации глубоких примесей в германии |
Type |
Journal Article |
| Year |
1983 |
Publication |
Физика и техника полупроводников |
Abbreviated Journal |
Физика и техника полупроводников |
| Volume |
17 |
Issue |
10 |
Pages |
1896-1898 |
| Keywords |
Ge, deep impurities |
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1762 |
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Гершензон, Е. М.; Литвак-Горская, Л. Б.; Рабинович, Р. И. |
| Title |
Отрицательное магнитосопротивление в случае проводимости по верхней зоне Хаббарда |
Type |
Journal Article |
| Year |
1983 |
Publication |
Физика и техника полупроводников |
Abbreviated Journal |
Физика и техника полупроводников |
| Volume |
17 |
Issue |
10 |
Pages |
1873-1876 |
| Keywords |
compensated n-InSb, Hubbard upper zone conductivity, negative magnetoresistance |
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1763 |
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Гершензон, Е. М.; Мельников, А. П.; Рабинович, Р. И.; Смирнова, В. Б. |
| Title |
О возможности создания инверсной функции распределения свободных носителей в полупроводниках при захвате на мелкие нейтральные примеси |
Type |
Journal Article |
| Year |
1983 |
Publication |
Физика и техника полупроводников |
Abbreviated Journal |
Физика и техника полупроводников |
| Volume |
17 |
Issue |
3 |
Pages |
499-501 |
| Keywords |
shallow neutral impurities, capture, inverse distribution function, Si |
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1764 |
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