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Author Yamashita, Taro; Miki, Shigehito; Qiu, Wei; Fujiwara, Mikio; Sasaki, Masahide; Wang, Zhen openurl 
  Title Temperature dependent performances of superconducting nanowire single-photon detectors in an ultralow-temperature region Type Journal Article
  Year 2010 Publication IEEE Trans. Appl. Supercond. Abbreviated Journal  
  Volume 21 Issue 3 Pages 336 - 339  
  Keywords SNSPD  
  Abstract We report on the performance of a fiber-coupled superconducting nanowire single-photon detector (SNSPD) from 4 K down to the ultralow temperature of 16 mK for a 1550 nm wave length. The system detection efficiency (DE) increased with de creasing the temperature and reached the considerably high value of 15% with a dark count rate less than 100 cps below 1.5 K, even without an optical cavity structure. We also observed saturation of the system DE in its bias current dependency at 16 mK, which indicates that the device DE of our SNSPD nearly reached intrinsic DE despite the device having a large active area of 20 μm × 20 μm. The dark count was finite even at 16 mK and the black body radiation becomes its dominant origin in the low temperatures for fiber-coupled devices.  
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  Call Number RPLAB @ gujma @ Serial 656  
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Author Yang, J.K.W.; Kerman, A.J.; Dauler, E.A.; Cord, B.; Anant, V.; Molnar, R.J.; Berggren, K.K. openurl 
  Title Suppressed critical current in superconducting nanowire single-photon detectors with high fill-factors Type Journal Article
  Year 2009 Publication IEEE Trans. Appl. Supercond. Abbreviated Journal  
  Volume 19 Issue 3 Pages 318-322  
  Keywords SNSPD  
  Abstract In this work we present a new fabrication process that enabled the fabrication of superconducting nanowire single photon detectors SNSPD with fill-factors as high as 88% with gaps between nanowires as small as 12 nm. This fabrication process combined high-resolution electron-beam lithography with photolithography. Although this work was motivated by the potential of increased detection efficiency with higher fill-factor devices, test results showed an unexpected systematic suppression in device critical currents with increasing fill-factor.  
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  Notes Approved no  
  Call Number RPLAB @ gujma @ Serial 677  
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Author Tretyakov, Ivan; Ryabchun, Sergey; Finkel, Matvey; Maslennikov, Sergey; Maslennikova, Anna; Kaurova, Natalia; Lobastova, Anastasia; Voronov, Boris; Gol'tsman, Gregory doi  openurl
  Title Ultrawide noise bandwidth of NbN hot-electron bolometer mixers with in situ gold contacts Type Journal Article
  Year 2011 Publication IEEE Trans. Appl. Supercond. Abbreviated Journal  
  Volume 21 Issue 3 Pages 620-623  
  Keywords NbN HEB mixer bandwidth  
  Abstract We report a noise bandwidth of 7 GHz in the new generation of NbN hot-electron bolometer (HEB) mixers that are being developed for the space observatory Millimetron. The HEB receiver driven by a 2.5-THz local oscillator offered a noise temperature of 600 K in a 50-MHz final detection bandwidth. As the filter center frequency was swept this value remained nearly constant up to the cutoff frequency of the cryogenic amplifier at 7 GHz. We believe that such a low value of the noise temperature is due to reduced radio frequency (RF) loss at the interface between the superconducting film and the gold contacts. We have also performed gain bandwidth measurements at the superconducting transition on HEB mixers with various lengths and found them to be in excellent agreement with the results of the analytical and numerical models developed for the HEB mixer with both diffusion and phonon cooling of hot electrons.  
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  Notes Approved no  
  Call Number RPLAB @ gujma @ Serial 716  
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Author Lobanov, Y.; Tong, E.; Blundell, R.; Hedden, A.; Voronov, B.; Gol'tsman, G. doi  openurl
  Title Large-signal frequency response of an HEB mixer: from 300 MHz to terahertz Type Journal Article
  Year 2011 Publication IEEE Trans. Appl. Supercond. Abbreviated Journal  
  Volume 21 Issue 3 Pages 628-631  
  Keywords waveguide NbN HEB mixers  
  Abstract We present a study of the large signal frequency response of an HEB mixer over a wide frequency range. In our experiments, we have subjected the HEB mixer to incident electromagnetic radiation from 0.3 GHz to 1 THz. The mixer element is an NbN film deposited on crystalline quartz. The mixer chip is mounted in a waveguide cavity, coupled to free space with a diagonal horn. At microwave frequencies, electromagnetic radiation is applied through the coaxial bias port of the mixer block. At higher frequencies the input signal passes via the diagonal horn feed. At each frequency, the incident power is varied and a family of I-V curves is recorded. From the curves we identify 3 distinct regimes of operation of the mixer separated by the phonon relaxation frequency and the superconducting energy gap frequency observed at about 3 GHz and 660 GHz respectively. In this paper, we will present observed curves and discuss the results of our experiment.  
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  Call Number RPLAB @ gujma @ Serial 719  
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Author Lobanov, Y.V.; Tong, C.-Y.E.; Hedden, A.S.; Blundell, R.; Voronov, B.M.; Gol'tsman, G.N. doi  openurl
  Title Direct measurement of the gain and noise bandwidths of HEB mixers Type Journal Article
  Year 2011 Publication IEEE Trans. Appl. Supercond. Abbreviated Journal IEEE Trans. Appl. Supercond.  
  Volume 21 Issue 3 Pages 645-648  
  Keywords waveguide NbN HEB mixers  
  Abstract The intermediate frequency (IF) bandwidth of a hot electron bolometer (HEB) mixer is an important parameter of the mixer, in that it helps to determine its suitability for a given application. With the availability of wideband low noise amplifiers, it is simple to measure the performance of an HEB mixer over a wide range of IF at a fixed LO frequency using the standard Y-factor method. This in-situ method allows us to measure both the gain and noise bandwidths simultaneously. We have also measured mixer output impedance with a vector network analyser. Intrinsic time constant has been extracted from the impedance data and compared to the mixer's bandwidths determined from receiver Y-factor measurement.  
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  Notes Approved no  
  Call Number RPLAB @ gujma @ Serial 720  
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